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Advanced Materials Programs & Projects

(showing 1 - 15 of 17)
Optical Characterization of Advanced Thin Films
Last Updated Date: 11/10/2015

A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in the … more

Laser Radiometry
Last Updated Date: 11/08/2015

Accurate characterization of photonic equipment is important for optical communications, medical devices, semiconductor lithography, manufacturing … more

Metrology and Synthesis of 3D Nanostructures
Last Updated Date: 10/13/2015

Nanostructures are a critical component of innovations in electronics, energy conservation, renewable energy, biomedical research, and health … more

Single Photonics and Quantum Information
Last Updated Date: 10/13/2015

The smallest unit of light is a “photon”. Generation, manipulation and measurement of light at or near the fundamental limit of a photon can … more

Terahertz Imaging and Sources
Last Updated Date: 10/13/2015

Imaging in the terahertz frequency range enables the detection of concealed weapons and other contraband (e.g., explosives under clothing) without … more

Nanostructure Fabrication and Metrology
Last Updated Date: 10/13/2015

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more

Quantum Processing
Last Updated Date: 10/05/2015

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Nanoelectronic Device Metrology
Last Updated Date: 08/25/2015

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Thin Film Electronics
Last Updated Date: 06/30/2015

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Quantum Conductance
Last Updated Date: 05/28/2015

Graphene, discovered in 2004, has truly extraordinary electronic properties that enable new approaches in many areas where conventional materials … more

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 01/22/2015

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 01/22/2015

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 01/22/2015

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 01/02/2015

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Advanced Materials Metrology
Last Updated Date: 12/12/2014

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the … more

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