TY  - JOUR
AU  - Maimon, Ory
AU  - Moser, Neil
AU  - Liddy, Kyle
AU  - Green, Andrew
AU  - Chabak, Kelson
AU  - Cheung, Kin (Charles)
AU  - Pookpanratana, Sujitra
AU  - Li, Qiliang
C2  - Semiconductor Science and Technology
DA  - 2023-06-09 04:06:00
DO  - https://doi.org/10.1088/1361-6641/acdaed
LA  - en
M1  - 38
PB  - Semiconductor Science and Technology
PY  - 2023
TI  - Measurement and Gate-Voltage Dependence of Channel and Series Resistances in Lateral Depletion-Mode β-Ga2O3 MOSFETs
ER  -