TY  - JOUR
AU  - Wang, Qi
AU  - Candell, Rick
AU  - Pang, Zhibo
AU  - Liang, Wei
C2  - IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN INDUSTRIAL ELECTRONICS
DA  - 2020-09-30 04:09:00
DO  - https://doi.org/10.1109/JESTIE.2021.3122839
LA  - en
PB  - IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN INDUSTRIAL ELECTRONICS
PY  - 2020
TI  - System Error Calibration in Large Datasets of Wireless Channel Sounding for Industrial Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930613
ER  -