TY  - JOUR
AU  - Tondare, Vipin
AU  - Villarrubia, John
AU  - Vladar, Andras
C2  - Microscopy and Microanalysis
DA  - 2017-09-18
DO  - https://doi.org/10.1017/S1431927617012521
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2017
TI  - 3D Nanometrology Based on SEM Stereophotogrammetry
ER  -