TY  - JOUR
AU  - Copeland, Craig
AU  - Geist, Jon
AU  - McGray, Craig
AU  - Aksyuk, Vladimir
AU  - Liddle, James
AU  - Ilic, Bojan
AU  - Stavis, Samuel
C2  - Light: Science & Applications
DA  - 2018-07-11
DO  - https://doi.org/10.1038/s41377-018-0031-z
LA  - en
M1  - 7
PB  - Light: Science & Applications
PY  - 2018
TI  - Subnanometer localization accuracy in widefield optical microscopy
ER  -