TY  - CONF
AU  - Li, Qiliang
AU  - Koo, Sang-Mo
AU  - Xiong, Hao
AU  - Edelstein, Monica
AU  - Suehle, John
AU  - Zhu, Xiaoxiao
AU  - Ioannou, D.
AU  - Richter, Curt
C2  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
DA  - 2007-09-30 00:09:00
LA  - en
PB  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
PY  - 2007
TI  - Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32634
ER  -