TY  - GEN
AU  - Carlos Beauchamp
AU  - Johanna Camara
AU  - Jennifer Carney
AU  - Steven Choquette
AU  - Kenneth Cole
AU  - Paul DeRose
AU  - David Duewer
AU  - Michael Epstein
AU  - Margaret Kline
AU  - Katrice Lippa
AU  - Enrico Lucon
AU  - Karen Phinney
AU  - Maria Polakoski
AU  - Antonio Possolo
AU  - Katherine Sharpless
AU  - John Sieber
AU  - Blaza Toman
AU  - Michael Winchester
AU  - Donald Windover
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-07-15 00:07:00
DO  - https://doi.org/10.6028/NIST.SP.260-136-2020
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
ER  -