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Building & Fire Research Instruments

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Measuring Topological Insulator Surface State Properties
Last Updated Date: 10/03/2014

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Atom Manipulation with the Scanning Tunneling Microscope
Last Updated Date: 10/03/2014

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Nanomagnet Dynamics
Last Updated Date: 10/03/2014

We develop techniques for measuring magnetization dynamics in magnetic nanostructures with a particular emphasis on the emerging needs of future … more

Dimensional Metrology for Nanofabrication
Last Updated Date: 10/03/2014

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Nanotube Metrology
Last Updated Date: 10/02/2014

Nanotube metrology improvement is a significant effort in the Particles, Tubes and Colloids project dedicated to improving the measurement methods … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 09/29/2014

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

COMPLETED: Nanoscale Thermal Properties Project
Last Updated Date: 09/05/2014

Our goal is to develop measurement techniques to characterize the changes in thermal transport and thermal transition temperatures in polymeric … more

Micro-rheometry
Last Updated Date: 09/04/2014

Our goal is to develop and promote the adoption of small-volume rheological methods for complex fluids including bio-fluids, suspensions and … more

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