Optical Radiation MeasurementsOptical Properties of Materials MeasurementsTechnical Contacts: Leonard Hanssen (38075S) Simon Kaplan (38075S) Please contact the technical staff before shipping instruments or standards to the address listed below. Mailing Address:
back to top | back to index of optical radiation measurements This laboratory's quality system is based on the ANSI/NCSL Z540-1-1994 standard and the ISO/IEC Guide 25. Spectral Transmittance Filters (38010C-38040C)
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| Service ID Number |
Recertification of NIST Photometric Standard Reference Materials SRM 930, SRM 1930, SRM 2930, SRM 2030, SRM 2031 |
Fee ($) |
|---|---|---|
| 38065C | Recertification of NIST photometric Standard Reference Materials SRM 930, SRM 1930, or SRM 2930 | 1317 |
| 38066C | Recertification of NIST photometric Standard Reference Material SRM 2031 | 1845 |
| 38067C | Recertification of NIST photometric Standard Reference Material SRM 2030 | 896 |
| 38068C | Replacement filter for NIST photometric Standard Reference Materials SRM 930, SRM 1930, SRM 2030 or SRM 2930 | 847 |
| 38069C | Replacement filter for NIST photometric Standard Reference Material SRM 2031 |
1269 |
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Recertification of NIST photometric Standard Reference Materials SRM 930, SRM 1930, or SRM 2930 (38065C)
NIST Standard Reference Material neutral density glass sets, or the commercial equivalent, will be recertified for transmittance density and transmittance at the appropriate visible wavelengths using the Material Measurement Laboratory's traceable transfer spectrometer. The certification of these filter sets expires after a period of two years.
Recertification of NIST photometric Standard Reference Material SRM 2031 (38066C)
NIST Standard Reference Material SRM 2031, or the commercial equivalent, will be recertified for transmittance density and transmittance at the appropriate ultraviolet and visible wavelengths using the Material Measurement Laboratory's traceable transfer spectrometer. The certification of these filter sets expires after a period of two years.
Recertification of NIST photometric Standard Reference Material SRM 2030 (38067C)
NIST Standard Reference Material SRM 2030, or the commercial equivalent, will be recertified for transmittance density and transmittance at the appropriate visible wavelengths using the Material Measurement Laboratory's traceable transfer spectrometer. The certification of these filter sets expires after a period of two years.
Replacement filter for NIST photometric Standard Reference Materials SRM 930, SRM 1930, SRM 2030 or SRM 2930 (38068C)
A replacement filter for NIST Standard Reference Material neutral density glass filter sets will be supplied and certified for transmittance density and transmittance at the appropriate visible wavelengths using the Material Measurement Laboratory's traceable transfer spectrometer. The certification of this filter expires after a period of two years.
Replacement filter for NIST photometric Standard Reference Material SRM 2031 (38069C)
A replacement filter for NIST Standard Reference Material SRM 2031 will be supplied and certified for transmittance density and transmittance at the appropriate ultraviolet and visible wavelengths using the Material Measurement Laboratory's traceable transfer spectrometer. The certification of this filter expires after a period of two years.
References-Spectrophotometric Measurements
Certified Transmittance Density Uncertainties for Standard Reference Materials using a Transfer Spectrophotometer, J. C. Travis (ret.), M. V. Smith, S. J. Choquette, and Hung-kung Liu, NIST Technical Note 1715 (2011).
NIST Measurement Services: Spectral Reflectance, P. Y. Barnes, E. A. Early, and A. C. Parr, Natl. Inst. Stand. Technol. Spec. Publ. 250-8 (revised 1997).
NIST High Accuracy Reference Reflectometer-Spectrophotometer, J. Res. Natl. Inst. Stand. Technol. 101(5) 619 (1996).
45 Degrees/0 Degrees Reflectance Factors of Pressed Polytetrafluoroethylene (PTFE) Powder, Natl. Inst. Technol. Stand. Tech. Note 1413 (1995).
Compliance in spectrometry: quality assurance of spectrophotometric measurements at NIST, J. J. Hsia, T. C. Larason, P. Y. Barnes, Spectrophotometry, Luminescence and Coulour; Science & Compl. (1995).
Comparison of Regular Transmittance Scales of Four National Standardizing Laboratories, K. L. Eckerle, J. Bastie, J. Zwinkels, V. Saprintsky, and A. Ulyanov, Color Res. Appl. 18 (1), 35-40 (Feb. 1993).
International Intercomparison of Regular Transmittance Scales, K. L. Eckerle, E. Sutter, G. H. C. Freeman, G. Andor, and L. Fillinger, Metrologia 27, 33-38 (1990).
NBS Measurement Services: Regular Spectral Transmittance, K. L. Eckerle, J. J. Hsia, K. D. Mielenz, and V. R. Weidner, Natl. Bur. Stand. (U.S.), Spec. Publ. 250-6 (July 1987).
Establishing a Scale of Directional-Hemispherical Reflectance Factor 1: The Van den Akker Method, W. H. Venable, Jr., J. J. Hsia, and V. R. Weidner, J. Res. Natl. Bur. Stand. (U.S.), 82 (1), 29 (July-Aug. 1977).
Permanence of Glass Standards of Spectral Transmittance, K. S. Gibson and M. A. Belknap, J. Res. Natl. Bur. Stand. (U.S.), 44, 463 (May 1950).
NIST-NPL comparison of mid-infrared regular transmittance and reflectance, C. J. Chunnilall, F. J. J. Clarke, M. P. Smart, L. M. Hanssen, S. G. Kaplan, Metrologia 40, S55-S59 (2003).
Comparison of near-infrared transmittance and reflectance measurements using dispersive and Fourier transform spectrophotometers, S. G. Kaplan, L. M. Hanssen, E. A. Early, . E. Nadal and D. Allen, Metrologia 39, 157-164 (2002).
Infrared regular reflectance and transmittance instrumentation and standards at NIST, S. G. Kaplan and L. M. Hanssen, Analytica Chimica Acta 380, 303-310 (1998).
Infrared diffuse reflectance instrumentation and standards at NIST, L. M. Hanssen and S. G. Kaplan, Analytica Chimica Acta 380, 289-302 (1998).
Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples, L. M. Hanssen, Applied Optics 40 (19), 3196-3204 (2001).
Testing the radiometric accuracy of Fourier transform infrared transmittance measurements, S. G. Kaplan, R. U. Datla and L. M. Hanssen, Applied Optics 36, 8896-8908 (1997).
Wavenumber Standards for Mid-infrared Spectrometry, L. M. Hanssen and C. Zhu, Reproduced from: Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths (Editors), 1-11 (2002).
Integrating Spheres for Mid- and Near-infrared Reflection Spectroscopy, L. M. Hanssen and K. A. Snail, Reproduced from: Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths (Editors), 1-19 (2002).
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Program questions: Calibrations Phone: 301-975-2200, Fax: 301-975-2950 NIST, 100 Bureau Drive, Stop 8363, Gaithersburg, MD 20899-8363