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Materials Science Ceramics Portal

Programs and Projects
Synchrotron X-ray Measurements

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron X-ray Measurement Method Development

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron Beamline Operations

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Crystallographic Databases

Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more

In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM

Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and operation of active nanostructures is … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Software
RMCProfile Utility Programs

NOTICE: Some anti-virus programs have incorrectly reported that downloadable software previously available from this Web page contains malware. … more

GPPois: Gaussian Processes for Poisson-noised data

 gppois is a Bayesian tool for learning about a smooth function based on noisy measurements of its values. Users train a model of the true … more

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Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

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