NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Portal 

Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Nanoscale Strength Measurements and Standards

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Scanning Probe Microscopy Measurements and Standards

Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Quantum Voltage System Development and Dissemination

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

*
Bookmark and Share

contact_18_1 

General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman