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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Synchrotron X-ray Measurements

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron X-ray Measurement Method Development

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron Beamline Operations

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Magnetic Nanoparticle Metrology

We are developing best practice metrology for characterization of magnetic nanoparticle systems (e.g. blocking temperature, anisotropy, property … more

Microscopy Methods

This project is developing means of quantitatively measuring chemical distributions in three dimensions at the nanometer scale in materials with … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman