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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Whole Cell Tomography

Our goal is to develop novel correlative microscopy approaches for locating and characterizing engineered metal nanoparticles within complex … more

Novel Sources for Focused-ion Beams

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale

The electrons in graphene are confined to the two-dimensional atomic layer of carbon atoms that make up the material . Since graphene was first … more

Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman