NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Events 
 

Characterization, Nanometrology, and Nanoscale Measurements Events

(showing 1 - 5 of 5)
Structure and Dynamics from Random Observations
Start Date: 03/20/2014

CNST Nanotechnology Seminar Series A. Ourmazd * Universi more

Frontiers of In Situ Transmission Electron Microscopy
Start Date: 04/11/2013

The significance and versatility of in situ transmission electron microscopy (TEM) has increased dramatically during the last 10 to 15 years. In … more

Frontiers of Characterization and Metrology for Nanoelectronics
Start Date: 03/25/2013

The location and dates for the 2015 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will be announced … more

Mid-Atlantic Microbeam Analysis Society 2012 Symposium
Start Date: 09/14/2012

A one-half day symposium on the advances to the field in the last 20 years that would have been of great interest to our colleague and friend … more

Cathodoluminescence Workshop 2011
Start Date: 10/24/2011

CL 2011 will bring together international expertise in the application of CL techniques to a wide variety of materials. CL techniques enable … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070