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Nanotechnology

Nanometrology

News and Updates

Projects and Programs

MNP Metrology Program

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
Schematic of interface engineering 2D materials.

Chemical Functionalization and Manipulation of Nano Materials

Ongoing
This project focuses on manipulating nanomaterials, including weakly bonded van der Waals systems, and probing emergent phenomena in these nanoengineered systems to impact technologies such as nanoelectronics, optoelectronics, quantum sensing, and quantum computing. Developing processes to
PTIR combines the spatial resolution of AFM with the specificity of absorption spectroscopy

Nano-Chemical Imaging and -Spectroscopy (IR, nIR, VIS)

Ongoing
The aim of this project is twofold: 1) improve the PTIR measurement (spectral range, signal to noise ratio, throughput, time resolution, information content, range of environmental conditions) and 2) apply PTIR to characterize nanomaterials in important applications. Examples or recent PTIR
EBIC Current

Neuromorphic Device Measurements

Ongoing
One type of device that is emerging as an attractive artificial synapse is the resistive switch, or memristor. These devices, which usually consist of a thin layer of oxide between two electrodes, have conductivity that depends on their history of applied voltage, and thus have highly nonlinear

Publications

Atom Probe Tomography Using an Extreme Ultraviolet Trigger Pulse

Author(s)
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to

Focused Ion Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements