NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements News 
 

Characterization, Nanometrology, and Nanoscale Measurements News

(showing 1 - 15 of 86)
CNST Releases the Spring/Summer 2015 Edition of The CNST News
Release Date: 07/28/2015

  The NIST Center for Nanoscale Science and Technology (CNST) Center for Nanoscale Science and Technology (CNST) is pleased to announce the … more

NIST ‘How-To’ Website Documents Procedures for Nano-EHS Research and Testing
Release Date: 06/30/2015

As engineered nanomaterials increasingly find their way into commercial products, researchers who study the potential environmental or health … more

Interface Engineering Leads to Advances in Organic Spintronics
Release Date: 06/30/2015

Sujitra Pookpanratana applies the organic monolayers onto the cobalt surfaces to tune the magnetic properties of the Co-molecule interface. … more

Hooked on Phonons: NIST-led Research Group Measures Graphene Vibrations
Release Date: 06/16/2015

An international research group led by scientists at the National Institute of Standards and Technology's (NIST) Center for Nanoscale Science and … more

NIST-led Research Group Creates First Whispering Gallery for Graphene Electrons
Release Date: 05/08/2015

GAITHERSBURG, MD--An international research group led by scientists at the U.S. Commerce Department’s National Institute of Standards and … more

Nanoelectronics Conference Focuses on Future of Semiconductor Manufacturing
Release Date: 04/22/2015

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts … more

It's a Trap! But That's Okay for Novel Light-Detecting Material
Release Date: 04/17/2015

Traps. Whether you’re squaring off against the Empire or trying to wring electricity out of sunlight, they’re almost never a good thing. But … more

New Imaging Technique Finds Formation of Aluminum Alloys to Blame for Next-Gen Battery Failures
Release Date: 03/03/2015

Researchers working at the National Institute of Standards and Technology (NIST), the University of Maryland, and Sandia National Laboratories, … more

Double Vision: New NIST Technique Can See Nanoscale 'Tree' and Microscale 'Forest' Simultaneously
Release Date: 03/03/2015

A close-up view of an individual tree won’t tell you much about what’s going on in the forest, or even what’s going on in the tree’s upper … more

Autonomous Atom Assembly of Nanostructures using a Scanning Tunneling Microscope
Release Date: 02/13/2015

Automated assembly of individual cobalt atoms on an atomically flat copper surface into simple geometric shapes, a square, a triangle, and a … more

Flip Out! Noncommittal Material Could Make For Hypersensitive Magnetic Direction Detector
Release Date: 02/03/2015

While the mysterious, unseen forces magnets project are now (mostly) well-understood, they can still occasionally surprise us. For instance, thin … more

NIST Sensor Could Improve One of Nano Research’s Most Useful Microscopes
Release Date: 12/16/2014

Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor … more

Research in Images: Cutaway View of Nanoparticles in a Neural Cell
Release Date: 11/26/2014

click on image for full-size version NIST's Precision Imaging Facility (PIF) in Boulder, Colo., provides a variety of advanced tools for precisely … more

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules
Release Date: 10/22/2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes … more

Simultaneous Imaging of Ferromagnetic and Ferroelectric Domains
Release Date: 10/01/2014

SEMPA image of a 15 µm-diameter cobalt iron d more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070