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Characterization, Nanometrology, and Nanoscale Measurements News

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No Compromises: JILA's Short, Flexible, Reusable AFM Probe
Release Date: 04/08/2014

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision … more

Looking Inside: Assessing the Chemical Composition of a Metal-Organic Framework with Nanoscale Resolution
Release Date: 03/11/2014

Mixed-linker metal–organic frameworks were characterized using photothermal induced resonance (PTIR), a novel technique that combines the lateral … more

NIST Microanalysis Technique Makes the Most of Small Nanoparticle Samples
Release Date: 02/24/2014

Researchers from the National Institute of Standards and Technology (NIST) and the Food and Drug Administration (FDA) have demonstrated that they … more

Steve Blankenship Wins AVS George T. Hanyo Award for Outstanding Performance in Technical Support of Research
Release Date: 12/16/2013

Steve Blankenship holds the Hanyo award certificate at the 2013 AVS International Symposium and Exhibition. Left to right: John Russell, Jr. … more

Characterizing Solar Cells with Nanoscale Precision Using a Low-Energy Electron Beam
Release Date: 12/04/2013

Electron beam induced current (red) superimposed on a scanning electron micrograph (gray). Bright contrast in the vicinity of grain boundaries more

The NIST Center for Nanoscale Science and Technology Develops and Deploys New NanoFab Management Software
Release Date: 11/18/2013

NEMO's tool reservation calendar allows onsite NanoFab users to make and change reservations with a simple click-and-drag.     The Center for … more

CNST Releases the Fall 2013 Edition of The CNST News
Release Date: 11/14/2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News . This … more

Researchers from U.S. and Korea Collaborate on Graphene Research
Release Date: 11/07/2013

Thermopower image of epitaxial graphene. The three distinct indexed regions correspond to (l) monolayer graphene, (ll) bilayer graphene, and (lll) … more

NIST Center for Nanoscale Science and Technology Researchers Introduce Blind Students to Nanoscale Science
Release Date: 09/19/2013

Physicists Kevin Twedt (left), who is visually impaired, and Vladimir Aksyuk (right) led a two day educational program to introduce a group of … more

New Nanoscale Imaging Method Finds Application in Plasmonics
Release Date: 07/16/2013

Researchers from the National Institute of Standards and Technology (NIST) and the University of Maryland have shown how to make nanoscale … more

New Quantum Dot Technique Combines Best of Optical and Electron Microscopy
Release Date: 06/12/2013

It's not reruns of "The Jetsons", but researchers working at the National Institute of Standards and Technology (NIST) have developed a new … more

CNST Hosts Workshop on In Situ Measurements using Transmission Electron Microscopy
Release Date: 06/06/2013

Three aspects of in situ transmission electron microscopy (TEM). On April 11 and 12, 2013, the NIST Center for Nanoscale Science and Technology … more

NIST Center for Nanoscale Science and Technology Featured on National Public Radio Affiliate WAMU
Release Date: 04/03/2013

The NIST Center for Nanoscale Science and Technology (CNST) was featured on the Friday, March 22 edition of Metro Connection , a weekly radio … more

Nanoscale Edge Variations Observed with Record-breaking Resolution in Magnetic Nanodevices
Release Date: 03/27/2013

Ferromagnetic resonance force microscopy image of the precession of an edge mode in a 500 nm diameter permalloy disk.  The disk appears as a blue … more

NIST Captures Chemical Composition with Nanoscale Resolution
Release Date: 02/12/2013

Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have demonstrated that a new spectroscopy … more

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