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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 1 - 15 of 66)
Advanced High Frequency Devices
Last Updated Date: 02/03/2016

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more

Quantum Voltage Project
Last Updated Date: 01/19/2016

Worldwide access to quantum-based DC voltage standards took a major step forward in 2014 with the introduction of NIST's first Standard Reference … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 12/21/2015

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Nanoscale Spin Dynamics
Last Updated Date: 12/18/2015

The Nanoscale Spin Dynamics Group develops metrology for magnetodynamic effects such as ferromagnetic resonance, switching, and damping. We apply … more

Spin Electronics
Last Updated Date: 12/18/2015

The Spin Electronics Group develops metrology to determine how spin currents can be generated and used to control and manipulate magnetization in … more

Probing Graphene Electronic Devices with Atomic Scale Measurements
Last Updated Date: 11/10/2015

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

RF Nano-electronics
Last Updated Date: 10/05/2015

The RF Nanoelectronics Project focuses on research and development of quantitative high-frequency metrology of RF nanomaterial, nanoelectronic and … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/08/2015

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/08/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/08/2015

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Nanoelectronic Device Metrology
Last Updated Date: 08/25/2015

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 07/24/2015

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Frequency Conversion Interfaces for Photonic Quantum Systems
Last Updated Date: 07/24/2015

Optical frequency conversion, in which the color of light is changed, is a process that has numerous applications in physics and technology. For … more

Electron Microscopy of Carbon Nanotube Composites
Last Updated Date: 07/24/2015

Carbon nanomaterials such as carbon nanotubes (CNTs) and graphene have an extraordinary combination of mechanical, electronic and thermal … more

In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM
Last Updated Date: 07/24/2015

Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and operation of active nanostructures is … more

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