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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 1 - 15 of 66)
Magnetodynamics and Spin Electronics
Last Updated Date: 02/23/2015

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

Novel Sources for Focused-ion Beams
Last Updated Date: 02/23/2015

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale
Last Updated Date: 02/02/2015

The electrons in graphene are confined to the two-dimensional atomic layer of carbon atoms that make up the material . Since graphene was first … more

AFM-Based Nanomechanics
Last Updated Date: 01/28/2015

Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to … more

Thin Film and Interconnect Reliability
Last Updated Date: 01/28/2015

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

Superresolving Optical Microscopy
Last Updated Date: 01/23/2015

Light microscopy is a widely used analytical tool because it provides non-destructive, real-time, three-dimensional imaging with chemical and … more

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 01/22/2015

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more

Synchrotron Beamline Operations
Last Updated Date: 01/22/2015

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Nanoparticle Measurements and Standards for Biomedical Applications and Health
Last Updated Date: 01/22/2015

Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical … more

Synchrotron X-ray Measurements
Last Updated Date: 01/22/2015

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Measurement and Prediction of Local Structure
Last Updated Date: 01/22/2015

Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials … more

Synchrotron X-ray Measurement Method Development
Last Updated Date: 01/22/2015

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Diffraction Metrology and Standards
Last Updated Date: 01/22/2015

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 01/22/2015

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 01/22/2015

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

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