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Chemical Analysis Portal

Programs and Projects
Optical Characterization of Advanced Thin Films

A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in the … more

Vacuum-Ultraviolet Optical Properties of Cryogenic Water Ices

The optical properties of cryogenic water ices in the vacuum-ultraviolet spectral range are studied. more

Calibration of the Extreme UV/X-ray Irradiance Sensor (EXIS) for the Geostationary Operations Environment Satellite R-Series Program (GOES-R)

Calibrations of the The Extreme ultraviolet/X-ray Irradiance Sensor (EXIS), which will be installed on the Geostationary Operations Environment … more

Biomagnetic Imaging

The biomagnetic imaging program develops standards, measurement methods, and new magnetic imaging modalities for biomedical and environmental … more

Micro- and Nanoelectromechanical Systems

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical … more

Seabird Tissue and Archival Monitoring Project (STAMP)

In 1999, the U.S. Fish and Wildlife Service Alaska Maritime National Wildlife Refuge (USFWS-AMNWR), the U.S. Geological Survey Biological … more

3D Atom Probe Tomography

The LEAP 4000X is a three-dimensional atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of … more

Electron Microprobe

The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old. It is capable of … more

Focused Ion Beam (Helios 650)

The Helios 650 NanoLab (HNL650) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and … more

Field Emission Electron Probe

The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and … more

Focused Ion Beam/Dual Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and … more

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a … more

Simulated Chromatographic Data

The following information is provided as an aid in the validation of mathematical models used in quantitation with chromatographic data. This data … more

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