Chemical Analysis Instruments

The LEAP 4000X is a three-dimensional atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of … more

The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other … more

The CM300FEG is a Transmission Electron Microscope equipped with spectroscopic detectors to allow chemical, elemental, and other analytical … more

The ASPEX Personal SEM (PSEM) is a tungsten filament scanning electron microscope optimized for automated particle analysis. The system was … more

Cressington model 208 carbon coater.

The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old. It is capable of … more

FEI Company, Model Quanta 200 F Field Emission Scanning Electron Microscope

The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and … more

The Helios 650 NanoLab (HNL650) is a Focused Ion Beam Scanning Electron Microscope equipped … more

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped … more

Cressington 208 HR Gold Sputter Coater

The SP5 is a laser scanning two-photon and confocal microscope equipped with multiple illumination sources, internal and external detectors, and … more

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from … more

The Eagle III Micro XRF unit is similar to a traditional XRF unit, with the primary difference being that the X-rays are focused by a … more

A JEOL model 7830F field emission source, scanning Auger microscope.