Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011
A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more
Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010
High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more
Last Updated Date: 10/05/2010
NIST researchers develop simulation tools to support modeling, measurement and fundamental understanding of micromagnetic physics.