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Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

Computational Micromagnetics
Last Updated Date: 10/05/2010

NIST researchers develop simulation tools to support modeling, measurement and fundamental understanding of micromagnetic physics.

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