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CNST Researchers Elucidate Micro-Optical Techniques for Solid-State Materials Characterization

July 27, 2011

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Contact: Kartik Srinivasan
301-975-5938

In a chapter of the recently published book Optical Techniques for Solid-State Materials Characterization,* CNST researchers provide a detailed overview and explanations of  micro-optical techniques in which far-field optics are used to perform optical spectroscopy on solid-state materials with micrometer-scale spatial resolution.  Writing at a level suitable for graduate students entering the field, the researchers present detailed descriptions of the design and implementation of micro-photoluminescence experiments.  In these experiments, an optically pumped material emits light that is collected and spectrally resolved, providing information about the electronic energy level structure of the material.  The chapter describes examples, including nanofabricated photonic crystal lasers and epitaxially-grown semiconductor quantum dots, in which these experimental techniques provide important data.  Incorporation of time-correlated single photon counting techniques and extensions to angle-resolved reflectivity, electroluminescence, and photoluminescence excitation spectroscopy are also explained.  As described by the publisher, “By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study.”

*Micro-optical techniques, K. Srinivasan, M. T. Rakher, and M. Davanco, in Optical Techniques for Solid-State Materials Characterization (Taylor and Francis, 2011), p. 575-618.

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