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Four-Point Probe: Jandel RM2


This tool measures the resistivity of samples by using the four point probe technique.  The probe consists of four equally spaced tips which pass a current through the outer probes and measures the voltage across the two inner probes.

Specifications / Capabilities:

  • Measures the resistance of a thin sheet of material
  • Height adjustable to cope with samples from thin layers to ingots
  • Lever operated probe with switched current leads to prevent sparking
  • Measures samples up to 10" deep
  • Width of sample limited only by need to support ends

Access Information:

Access to this tool requires that you have attended NanoFab safety orientation, passed the safety test, and have been propertly trained on the tool.  If you have any questions, please contact the NanoFab User Coordinator, or the tool contact person.




Four-Point Probe: Jandel RM2

Operating Schedule:

Access to this machine follows standard NanoFab operating hours (7am - 7pm Monday - Friday).  Out of hours access requires prior approval by the NanoFab Manager.


Name: Jerry Bowser
Phone: 301.975.8187
Email: nanofab_metrology@nist.gov
100 Bureau Drive, Stop 6201
Gaithersburg, MD 20899-6201