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Atomic Force Microscope 2: Digital Instruments/Veeco Dimension 3000

Description:

CORAL Name:  AFM 2

A tool used to study the material surface characteristics, check the surface patterns generated by nanofabrication. It can take samples up to 200mm in diameter and 12mm in thickness.

Specifications / Capabilities:

  • Tapping mode; Contact mode; Phase mode 
  • Magnetic force microscopy 
  • Scanning tunneling microscopy 
  • Stepper-motor controlled stage 
  • Top view optical microscopy of scanning area

Scientific Opportunities / Applications:

  • Surface characterization for thin films 
  • Pattern characterization for lithography structures, magnetic media, CD/DVDs 
  • Biomaterials, optics and other samples

Access Information:

Access to this tool requires that you have attended NanoFab safety orientation, passed the safety test, and have been properly trained on the tool. If you have any questions, please contact the NanoFab User Coordinator, or the tool contact person.

NANOFAB USER MANUAL

SCHEDULE TRAINING

afm

Operating Schedule:

Access to this machine follows standard NanoFab operating hours (7am - 7pm Monday - Friday).  Out of hours access requires prior approval by the NanoFab Manager.

Contact

Name: Chet Knurek
Phone: 301.975.2515
Email: nanofab_metrology@nist.gov
Address:
100 Bureau Drive, Stop 6201
Gaithersburg, MD 20899-6201