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Device Design and Characterization Information at NIST
(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009 Presentations (05/28/2009)
2010 NIST Mobile Microrobotics Challenge (05/03/2010)
2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2011 Presentations (05/25/2011)
CMOS Device and Reliability (06/12/2015)
FCMN, 2007 Presentations (05/03/2011)
FCMN, Publications and Talks (04/23/2015)
Nanoelectronic Device Metrology (08/25/2015)
Nanoscale and Quantum Metrology (05/26/2015)
Nanoscale Stress Measurements and Standards (01/05/2015)