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Electronics & Telecommunications News

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Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor
Release Date: 11/25/2008

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key … more

Bright Idea Illuminates LED Standards
Release Date: 11/25/2008

The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of … more

NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more

Cold Atoms Could Replace Hot Gallium in Focused Ion Beams
Release Date: 11/12/2008

Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a … more

Improved Measurements Could Mean Safer, More Reliable Electroshock Weapons
Release Date: 11/12/2008

Electroshock weapons - such as stun guns and other similar devices that temporarily incapacitate a person by delivering a high-voltage, … more

New Report on NIST Tests of Wireless Environment in Auto Factories
Release Date: 10/14/2008

A new report describes tests carried out by the National Institute of Standards and Technology (NIST) of the wireless environment in automotive … more

Bottoms Up: Better Organic Semiconductors for Printable Electronics
Release Date: 09/03/2008

Researchers from the National Institute of Standards and Technology (NIST) and Seoul National University (SNU) have learned how to tweak a new … more

Vegas ‘Quantum Spookshow’ Demos On-the-Fly Encryption of Streaming Video
Release Date: 08/06/2008

Las Vegas shows often are on the cutting edge. Following this tradition, researchers from the National Institute of Standards and Technology … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Exposing the Sensitivity of Extreme Ultraviolet Photoresists
Release Date: 06/24/2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation … more

NIST/NIH Micromagnets Show Promise as Colorful 'Smart Tags' for Magnetic Resonance Imaging
Release Date: 06/18/2008

Microscopic magnets (above left), designed and tested in a joint NIST/NIH project, might one day be injected into the body to add color and “smart … more

Micromagnets Show Promise as Colorful 'Smart Tags' for MRI
Release Date: 06/18/2008

Microscopic magnets (above left), designed and tested in a joint NIST/NIH project, might one day be injected into the body to add color and “smart … more

NIST’s Novel ‘Noise Thermometry’ May Help Redefine International Unit of Temperature
Release Date: 06/10/2008

After seven years of work, researchers at the National Institute of Standards and Technology (NIST) have built a system that relies on the “noise” … more

Novel Laser Attenuator
Release Date: 06/02/2008

A laser attenuator having a well-known and stable attenuation can extend the usefulness of an optical power meter for laser radiometry. The … more

Learn About 'NIST and Nanosoccer' from New Web Site and Video
Release Date: 05/28/2008

If you love soccer but don’t want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the … more

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