Electronics & Telecommunications Programs & Projects | |
|
Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 12/07/2012 This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more
Infrared optical properties of materials and components
Last Updated Date: 11/15/2012 Accurate measurements of the optical properties of materials in the infrared spectral range play an increasingly important role in the aerospace … more
Quantum Sensors
Last Updated Date: 11/14/2012 The Quantum Sensors Project develops sensors based on quantum phenomena for spectroscopy, imaging, and other precision measurements for … more
Quantum Information and Measurements
Last Updated Date: 11/14/2012 America's future prosperity and security may rely in part on the exotic properties of quantum mechanics. Research on quantum information (QI) … more
Quantum Voltage System Development and Dissemination
Last Updated Date: 11/14/2012 This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more
Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012 Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more
Future Directions for Magnetic Sensors
Last Updated Date: 10/05/2012 Our goal is to develop the scientific understanding needed to allow modeling and simulation to become the driving force in improving magnetic … more
Magnetic Nanostructures for post-CMOS Electronics
Last Updated Date: 10/05/2012 Our goal is to address the metrology of magnetic effects at the nanoscale level. Nanomagnet arrays form the basis for major data storage … more
Fatigue in Silicon
Last Updated Date: 10/02/2012 Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation … more
Energy Determination of X-Ray Transition Energies Using the NIST TES Microcalorimeter Detector
Last Updated Date: 10/02/2012 Previous efforts to produce a comprehensive tabulation of atomic x-ray transition energies have been hampered by the fact that a) detectors having … more
Optical Characterization of Advanced Thin Films
Last Updated Date: 10/02/2012 A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in … more
Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 10/02/2012 Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more
Physical Properties of Liquid Precursors
Last Updated Date: 10/02/2012 In striving to adhere to Moore's Law, the semiconductor industry is designing and using new metal-organic compounds. Precursor compounds … more
Magnetic Imaging
Last Updated Date: 10/02/2012 Our goal is to develop a real-time magnetic domain imaging system and apply it to technologically important systems, including data-storage and … more
Lead-Free Surface Finishes for Electronic Components: Tin Whisker Growth
Last Updated Date: 10/02/2012 This project will provide data and materials measurements necessary to improve the reliability of solder interconnects degraded by the switch to … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |