Electron Microscopy (EM, TEM, SEM, STEM) Information at NIST

  • 3D Atom Probe Tomography

  • Aberration Corrected Analytical Electron Microscope

  • Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation

  • Analysis of Copper Incorporation Into Zinc Oxide Nanowires

  • Analytical Electron Microscope

  • Analytical Transmission Scanning Electron Microscopy

  • Andrew A. Herzing

  • Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles

  • Atomic Scale Imaging of Nanoscale Structures with Elemental Sensitivity in the NIST Titan 80-300

  • Carbon Evaporator Coater

  • Cathodoluminescence Workshop 2011

  • CNST Releases the Spring 2012 Edition of The CNST News

  • CNST Releases the Summer 2012 Edition of The CNST News

  • Doug Meier

  • DTSA-II Reinvention of a Classic

  • Electron holography

  • Environmental Scanning Electron Microscope

  • Evaluation of the Extent of Electron Scattering in a Low Vacuum Scanning Electron Microscope

  • Focused Ion Beam (Helios 650)

  • Focused Ion Beam/Dual Beam

  • Frank W. Gayle

  • Frederick Meisenkothen

  • Frontiers of In Situ Transmission Electron Microscopy

  • Gold Sputter Coater

  • Guangjun Cheng

  • Hacking the SEM: Crystal Phase Detection for Nanoscale Samples

  • Ian M. Anderson

  • In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM

  • In-Situ Observations Reveal How Nanoparticle Catalysts Lower Operating Temperatures in Fuel Cells

  • John Bonevich

  • Joseph Conny

  • Jungpil Seo

  • Justin Gorham

  • Kate Klein

  • Laser Scanning Two Photon and Confocal Microscope

  • Metrology of High Current Density Electron Field Emitters

  • Microanalysis Research Group Facilities

  • Microanalysis Research Group Staff

  • Microcalorimeter Detector

  • Microscopy Methods

  • Mid-Atlantic Microbeam Analysis Society 2012 Symposium

  • Mitigation of Systematic Errors in EFTEM Spectral Imaging via Median Filtering

  • MML Microscopy Facility

  • MML Microscopy Facility Instrumentation

  • NIST Puts a New Twist on the Electron Beam

  • Pedram Roushan

  • R. Lance King

  • Renu Sharma

  • Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst

  • Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

  • Robert Keller

  • Scanning Auger Microprobe

  • Scott A. Wight

  • See What You’re Missing: New Tomography Holder

  • Shirley Turner

  • Spin Polarized Supercurrents Optimized with a Simple Flip

  • Three-Dimensional Nanometer Metrology

  • Trophic Transfer of Nanoparticles in a Simplified Invertebrate Food Web