International Biometrics Conference to Meet at NIST March 2-4

The National Institute of Standards and Technology (NIST) is co-sponsoring an international conference on biometric performance March 2-4 at NIST headquarters in Gaithersburg, Md. Related workshops will be held March 1 and March 5.

The "International Biometric Performance Conference (IBPC): Performance, Evaluation and Specification of Biometric Technologies" will bring together biometric users, technology providers, integrators and evaluators. The conference aims to identify how the accumulated experience of the past decade (research, evaluation, deployment, outcomes) can be leveraged to direct future biometrics-based research and applications. The conference will address the required properties of core algorithms used to determine if two sets of biometric data, such as fingerprints or voice prints, belong to the same individual. Another goal is to identify novel evaluation methodologies and recent trends in testing and determine what performance criteria are most relevant in the context of the contemporary and emerging marketplaces.

Three separate workshops will be held in conjunction with the conference. They will address fingerprint image quality, biometric template protection testing, and fingerprint feature conformance.

The IBPC 2010 conference is co-sponsored by NIST, the National Physical Laboratory (UK) and Fraunhofer Institute for Computer Graphics Research (Germany). Registration deadline is Feb. 24.

For more information on the conference, see the conference program at http://biometrics.nist.gov/ibpc2010/program.pdf. To register, go to https://www.fbcconferences.com/nist_biometrics/atreg1.aspx. Press interested in attending should contact Evelyn Brown at evelyn.brown [at] nist.gov (evelyn[dot]brown[at]nist[dot]gov).