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Latent Testing Workshop 2006
The Latent Testing Workshop 2006 was held at the National Institute of Standards and Technology in Gaithersburg, Maryland on April 5th & 6th 2006. The report of the workshop is NISTIR 7377 "Summary of the NIST Latent Fingerprint Testing Workshop".
Background and Purpose
Searches of latent fingerprints against rolled impressions, against plain impressions (slaps or flats), or against latent fingerprints repositories are of rapidly increasing importance. Of particular value is the ability to do real-time screening against latent prints. It is projected that present processes and technologies will have difficulty in coping with the anticipated volumes. Accordingly, there is great interest in determining how the latent identification process can be expedited. Effective methods for obtaining system performance parameters such as reliability and search-speed/throughput are required to gauge progress.
The purpose of this workshop was to provide a joint Government-Industry forum for discussing topics which will lead to better understanding of testing of latent algorithms, latent search performance, and related areas. Specific topics include:
The workshop was sponsored by the Department of Homeland Security, Science and Technology Directorate(S & T).
The workshop was organized and sponsored by the Information Access Division of the Information Technology Laboratory (ITL) at the National Institute of Standards and Technology (NIST).
The workshop was supported by the Department of Defense, Biometric Management Office.