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This is a list of some of the past publications of W. F. Guthrie

 

More recent publications and a mechanism to search a database containing many of the most recent publications of the National Institute of Standards and Technology (NIST) can be accessed here.

 

C. R. Hagwood, W. F. Guthrie (to appear) 
Combining Data in Small Multiple Method Studies
Technometrics

C. R. Hagwood, W. F. Guthrie (2006) 
Combining Data in Small Multiple Method Studies
Technometrics

H. Liu, W. F. Guthrie, D. Malec, G. Yang (2004) 
MCMC in StRD
Proceedings of the 2003 Quality and Productivity Conference

H. H. Xu, S. Takagi, L. Sun, L. Hussain, L. C. Chow, W. F. Guthrie, J. H. Yen (2006) 
Development of a nonrigid, durable calcium phosphate cement for use in periodontal bone repair
Journal of the American Dental Association, Vol. 137, pp.1131-1138

C. F. Ferraris, W. F. Guthrie, I. Aviles, R. K. Haupt, B. S. MacDonald (2005) 
Certification of SRM 114q: Phase I
NIST SP 161, 30 p.

A. Hornikova, W. F. Guthrie (2005) 
A Survey of Key Comparisons
Proceedings of the 2005 Measurement Science Conference, 12 p.

R. A. Allen, A. Hunt, C. E. Murabito, B. Park, W. F. Guthrie, M. W. Cresswell (2005) 
Extraction of Critical Dimension Reference Feature CDs from New Test Structure Using HRTEM Imaging
Proceedings of the International Conference on Microelectronic Test Structures (ICMTS)

M. W. Cresswell, W. F. Guthrie, R. G. Dixson, R. A. Allen, C. E. Murabito, B. Park, J. V. Martinez de Pinillos (2005) 
Single-Crystal Critical Dimension Prototype Reference Materials
NIST Report of Investigation for RM 8111, 27 p.

M. W. Cresswell, B. Park, R. A. Allen, W. F. Guthrie, R. G. Dixson, W. M. Tan, C. E. Murabito (2005) 
Comparison of SEM and HRTEM CD Measurements Extracted from Test-Structures Having Feature Linewidths from 40 nm to 240 nm
Proceedings of the 2005 International Conference on Microelectronic Test Structures (ICMTS)

M. W. Cresswell, R. G. Dixson, W. F. Guthrie, R. A. Allen, C. E. Murabito, B. Park, J. V. Martinez de Pinillos, A. Hunt (2005) 
CD Reference Features with Sub-Five Nanometer Uncertainty
Proceedings of the International Society for Optical Engineering (SPIE), Microlithography 2005

R. A. Bryant, T. J. Ohlemiller, E. L. Johnsson, A. Hamins, B. S. Grove, W. F. Guthrie, A. Maranghides, G. W. Mulholland (2004) 
NIST 3 Megawatt Quantitative Heat Release Rate Facility: Description and Procedures
NISTIR 7052, 130 p.

Z. Q. Lu, W. F. Guthrie (2004) 
Bayesian Methods for Statistical Inference on the Common Mean from Multiple Data Sources
Proceedings of ASPE 2004 Summer Topic Meeting - Uncertainty Analysis in Measurement and Design, pp 95-99.

C. G. Simon, W. F. Guthrie, F. W. Wang (2004) 
Cell Seeding into Calcium Phosphate Cement
Journal of Biomedical Materials Research, Volume 68A, pp 628-639.

A. Hornikova, W. F. Guthrie (2004) 
Troubleshooting Key Comparisons (A Survey of Design, Analysis, and Reporting of Results in Key Comparisons)
Proceedings of the 2004 Joint Statistical Meetings, pp 2021-2028.

H. Liu, W. F. Guthrie, D. Malec, G. Yang (2004) 
MCMC in StRD
Proceedings of the 2004 NCSL International Workshop and Symposium, Salt Lake City, UT, 10 p.

R. A. Bryant, T. J. Ohlemiller, E. L. Johnsson, A. Hamins, B. S. Grove, W. F. Guthrie, A. Maranghides, G. W. Mulholland (2003) 
NIST 3 Megawatt Quantitative Heat Release Rate Facility
NIST SP 1007, 81 p.

C. M. Croarkin, P. Tobias, J. J. Filliben, B. Hembree, W. F. Guthrie, J. Prins, C. Zey, N. A. Heckert, L. Trutna (2003) 
NIST/SEMATECH e-Handbook of Statistical Methods
NIST Handbook 151

R. L. Paul, D. S. Simons, W. F. Guthrie, Z. Q. Lu (2003) 
Radiochemical Neutron Activation Analysis for Certification of Ion-Implanted Phosphorus in Silicon
Anal. Chem., 75 (16), 4028 -4033, 2003

G. C. Turk, L. L. Yu, M. L. Salit, W. F. Guthrie (2002) 
Using Inductively Coupled Plasma-Mass Spectrometry for Calibration Transfer Between Environmental CRMs
Fresenius Journal of Analytical Chemistry, Volume 370, pp 259-263.

W. F. Guthrie, B. W. Mangum, G. F. Strouse (2002) 
Summary of Comparison of Realizations of the ITS-90 over the Range 83.8058 K to 933.473 K: CCT Key Comparisons 3
Metrologia, Volume 39, pp 179-205.

W. F. Guthrie (2002) 
Should (T1-T2) Have Larger Uncertainty Than T1?
Proceedings of the 8th International Conference on Temperature: Its Measurements and Control, Volume 2, pp. 887-892.

M. Winchester, B. S. MacDonald, G. C. Turk, J. L. Mann, W. R. Kelly, W. F. Guthrie (2001) 
An Alternative Method for the Certification of S Mass Fraction in Coal Standard Reference Materials
Fresenius Journal of Analytical Chemistry, Volume 370, pp 234-240

W. F. Guthrie, M. VanLandingham, J. S. Villarrubia, L. Van Burren (2001) 
Nanoindentation of Polymers: An Overview.
Advances in Scanning Probe Microscopy of Polymers. Macromolecular Symposia. Volume 167. Proceedings. 2001, Tsukruk, V. V.; Spencer, N. D., Editors, 15-44 pp, 2001.

W. F. Guthrie, G. F. Banks, K. Eberhardt, L. Gill, M. Levenson, H. Liu, M. Vangel, J. H. Yen, N. Zhang (2000) 
An Approach to Combining Results From Multiple Methods Motivated by the ISO GUM
Journal of Research of the National Institute of Standards and Technology, Volume 105, pp 571-579.

W. F. Guthrie, M. W. Cresswell, M. W. Guillaume, W. E. Lee, R. A. Allen, R. Ghoshtagore, Z. E. Osborne, N. Sullivan, L. W. Linholm (2000) 
Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries
IEEE Transactions on Semiconductors Manufacturing, Volume 12, No. 2, pp 154-165.

W. F. Guthrie, M. Levenson, R. G. Gann, K. D. Steckler, S. Ruitberg (2000) 
Relative Ignition Propensity of Test Cigarettes
NIST Tech. Note 1436, 30 p.

M. W. Cresswell, R. A. Allen, W. F. Guthrie, J. J. Sniegowski, R. Ghoshtagore, L. W. Linholm (1998) 
Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications
IEEE Transactions on Semiconductor Manufacturing, Vol. 11, No. 2, pp. 182-193.

M. W. Cresswell, N. M. Guillaume, R. A. Allen, W. F. Guthrie, R. Ghoshtagore, J. C. Owen, Z. E. Osborne, N. Sullivan, L. W. Linholm (1998) 
Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries
Proceedings of the IEEE International Conference on Microelectronic Test Structures, pp. 29-38.

S. Mayo, J. J. Kopanski, W. F. Guthrie (1998) 
Intermittent-Contact Scanning Capacitance Microscopy Imaging and Modeling for Overlay Metrology
Characterization and Metrology for ULSI Technology, American Institute of Physics Conference Proceedings 449, pp. 567-572

W. E. Lee, W. F. Guthrie, M. W. Cresswell, R. A. Allen, J. J. Sniegowski, L. W. Linholm (1997) 
Reference-Length Shortening by Kelvin Voltage Taps in Linewidth Test Structures Replicated in Monocrystalline Silicon Films
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 10, pp. 35-38.

N. J. Carino, G. M. Mullings, W. F. Guthrie (1997) 
Evaluation of ASTM Standard Consolidation Requirements for Preparing High-Strength Concrete
High Performance Concrete: Design and Materials and Recent Advances in Concrete Technology, , Proceedings of the International Conference on High-Performance Concrete, American Concrete Institute Special Publication 172, pp 733-768.

M. W. Cresswell, J. J. Sniegowski, R. Ghoshtagore, R. A. Allen, W. F. Guthrie, L. W. Linholm (1997) 
Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 10, pp 16-24.

M. W. Cresswell, J. J. Sniegowski, R. Ghoshtagore, R. A. Allen, W. F. Guthrie, A. W. Gurnell, L. W. Linholm, R. G. Dixson, E. C. Teague (1996) 
Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes
Japanese Journal of Applied Physics, Vol. 35, Part 1, No. 12B, pp 6597-6609.

M. W. Cresswell, R. A. Allen, L. W. Linholm, W. F. Guthrie, A. W. Gurnell (1996) 
Hybrid Optical-Electrical Overlay Test Structure
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 9, pp. 9-12.

M. A. Schen, F. I. Mopsik, W. Wu, W. E. Wallace, N. C. Beck-Tan, G. T. Davis, W. F. Guthrie (1996) 
Advances in the Measurement of Polymer CTE: Micrometer to Atomic-Scale Measurements
Proceedings of the 211th American Chemical Society National Meeting, Division of Polymer Chemistry, Vol. 37, No. 1, pp 180-182.

C. Lobo, W. F. Guthrie, R. N. Kacker (1995) 
A Study on the Reuse of Plastic Concrete Using Extended Set-Retarding Admixtures
Journal of Research of the National Institute of Standards and Technology, Vol. 100, No. 5, 1995, pp. 575-589

N. J. Carino, E. S. Lagergreen, W. F. Guthrie (1994) 
Effects of Testing Variables on the Measured Compressive Strength of High-Strength (90 Mpa) Concrete
NISTIR 5405

N. J. Carino, W. F. Guthrie, E. S. Lagergreen, G. M. Mullings (1994) 
Effects of Testing Variables on the Strength of High-Strength (90 Mpa) Concrete Cylinders
High Performance Concrete, Proceedings of the International Conference on High Performance Concrete, American Concrete Institute Special Publication 149, pp. 589-632

M. A. Schen, G. T. Davis, F. I. Mopsik, W. F. Guthrie, W. T. Chen, E. Livingston, L. Lee, W. Robbins, C. Lee, P. Henderson, M. L. Pecht, C. Y. Lee, J. Dion, e. al. (1994) 
An Industry/Government/University Partnership: Measuring Sub-Micrometer Strain in Polymer Films
Proceedings of the IPC Printed Circuits Expo

G. W. Burns, M. G. Scrogen, G. F. Strouse, C. M. Croarkin, W. F. Guthrie (1993) 
Temperature Electromotive Force Reference Functions and Tables for the Letter-Designated Thermocouple Types Based on the ITS-90
National Institute of Standards and Technology Monograph 175, 270 p.

G. W. Burns, G. F. Strouse, B. W. Magnum, C. M. Croarkin, W. F. Guthrie (1992) 
New Reference Function for Platinum-10% Rhodium vs. Platinum (Type S) Thermocouples Based on the ITS-90, Parts I and II
Proceedings of the 7th International Symposium on Temperature, pp 537-546.

G. W. Burns, G. F. Strouse, C. M. Croarkin, W. F. Guthrie, M. Chattle (1992) 
New Reference Functions for Platinum-30% Rhodium vs. Platinum-6% Rhodium (Type B) and Platinum-13% Rhodium vs. Platinum (Type R) Thermocouples Based on the ITS-90
Proceedings of the 7th International Symposium on Temperature, pp 559-564.

W. F. Guthrie, C. M. Croarkin, G. W. Burns, G. F. Strouse, e. al. (1992) 
Statistical Analysis of Type S Thermocouple Measurements on the International Temperature Scale of 1990
Proceedings of the 7th International Symposium on Temperature, pp 547-552.