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Physical Measurement Laboratory / Sensor Science Division

Surface and Interface Metrology Group

Projects/Programs

Displaying 1 - 15 of 15
color and appearance diagram

Color and appearance

Ongoing
We are developing instrumentation, standards artifacts, and measurement protocols to characterize appearance attributes including color, texture, and gloss
Harnessing EUV capabilities for non-destructive metrology

EUV Scatterometry

Ongoing
The state of the art for measurement and inspection of the smallest printed features on an integrated circuits (IC) chip is a combination of electron scanning
autonomous vehicles view from above

NIST Automated Vehicles Program

Ongoing
Building on a successful first-year Strategic and Emerging Research Initiatives (SERI) project NIST and Autonomous Vehicles (see 2022 NIST AV workshop and
This image shows 3-dimensional topographic surface maps of the breech face and firing pin impressions left in the primer at the base of the cartridge case.

NIST Ballistics Toolmark Database

Ongoing
The NIST Ballistics Toolmark Research Database is an open-access research database of bullet and cartridge case toolmark data. This database will: foster the

Optical grating scatterometry

Ongoing
This program aims to develop standards, methods, and modeling for assessing the periodic structures using optical reflectance and transmittance measurements.
spatial frequency domain Mueller matrix imager

Optical Polarization Metrology

Ongoing
This program aims to improve the metrology of optical polarization by developing new measurement methods and theoretical understanding of polarization phenomena

Optical scattering from surfaces

Ongoing
We study how material properties, surface topography, and contaminants affect the distribution of light scattered from surfaces. Our aim is to support industry
skin reflectance graphs

Reflectance Measurements of Human Skin

Ongoing
The purpose of this human subjects study is to collect high-quality measurements of the reflectance spectrum of human skin and assess the variability across the
reflector

Spectral Reflectance and Transmittance

Ongoing
NIST maintains the national scales for reflectance and transmittance in the ultraviolet, visible, and near-infrared spectral regions (250 nm to 2500 nm). Our
spectrophotometric processes illustration

Spectrophotometry

Ongoing
Spectrophotometry is a quantitative measurement technique that allows scientists to investigate the optical properties of materials over a wide wavelength range