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Manufacturing Metrology Length Information at NIST

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Algorithm Testing (03/25/2009)
Bala Muralikrishnan (11/19/2008)
Beverly F. Payne (10/08/2010)
Beverly M. Connelly (11/17/2008)
Bruce R. Borchardt (11/19/2008)
Bryon S. Faust (11/17/2008)
Christopher Blackburn (11/19/2008)
Daniel S. Sawyer (06/10/2014)
David J. Evans (08/18/2010)
Dennis S. Everett (11/17/2008)