Manufacturing Metrology Portal

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more

Additive manufacturing (AM) processes have great potential for making high-value, complex, individually-customized parts, but several technical … more

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more