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Manufacturing Metrology Portal

Programs and Projects
Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Small Force and Mass Metrology

The Small Force and Mass Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad … more

Mise-en-pratique of the Redefined Kilogram

This project will conduct the research and development required to support the international efforts to prepare for a future redefinition of the … more

Dimensional Measurement Services

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Atom-Based Dimensional Metrology

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

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Gaithersburg, MD 20899-1070