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Manufacturing Metrology Portal

Programs and Projects
Advanced Dimensional Measurement Systems for Manufacturing

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

SI Length and Traceability

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Digital Thread for Smart Manufacturing

We live in a new manufacturing era that has been called the Third Industrial Revolution [1] , which is characterized by the digitization of … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Nano-Structured Optics and Optical Surface Metrology

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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General Information:
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inquiries@nist.gov

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