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Manufacturing Metrology Portal

Programs and Projects
Advanced Dimensional Measurement Systems for Manufacturing

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

SI Length and Traceability

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nano-Structured Optics and Optical Surface Metrology

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Dimensional Measurement Services

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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inquiries@nist.gov

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