Manufacturing Programs & Projects | |
|
Sustainability of Unit Manufacturing Processes Project
Last Updated Date: 05/17/2013 To advance sustainable manufacturing practices and promote resource efficiency, U.S. industries need reliable measurement methods to evaluate a … more
MEMS Measurement Science and Standards
Last Updated Date: 05/09/2013 Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more
Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 05/09/2013 We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more
Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/08/2013 Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more
Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/03/2013 The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more
Department of Homeland Security Urban Search and Rescue Robot Performance Standards
Last Updated Date: 05/02/2013 FEMA Responders often face daunting challenges during search and rescue tasks in dangerous environments. As such, the concept of including robots … more
SCORE (System, Component and Operationally Relevant Evaluations)
Last Updated Date: 05/02/2013 SCORE (System, Component and Operationally Relevant Evaluations) is a unified set of criteria and software tools for defining a performance … more
Fundamental Measurement Science for Additive Processes Project
Last Updated Date: 04/30/2013 Additive manufacturing (AM) processes have great potential for making high-value, complex, individually-customized parts, but several technical … more
Three-Dimensional Nanometer Metrology
Last Updated Date: 04/30/2013 Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more
Dimensional Measurement Services
Last Updated Date: 04/23/2013 The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more
SI Length and Traceability
Last Updated Date: 04/19/2013 In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more
Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013 Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more
Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013 A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more
Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013 Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more
Nanoparticle Metrology
Last Updated Date: 04/19/2013 We are advancing the measurement of dimension and function of engineered nanoparticles for biomedical research, manufacturing, and environmental … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |