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Manufacturing Programs & Projects

(showing 1 - 15 of 93)
Characterization of Additive Manufacturing Materials
Last Updated Date: 05/21/2015

Currently there is a lack of AM parts in high-performance applications, due to a lack of publicly available high-fidelity data that has associated … more

SI Length and Traceability
Last Updated Date: 05/21/2015

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 05/19/2015

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 05/19/2015

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Smart Grid System Testbed Facility
Last Updated Date: 05/19/2015

NIST is charged by the 2007 Energy Independence and Security Act (EISA) with facilitation of interoperability standards to enable successful … more

Performance Metrics and Benchmarks to Advance the State of Robotic Grasping
Last Updated Date: 05/19/2015

With a growing number of robot hands, there is an increasing need to capture their individual competencies and characteristics under a unified … more

Thin Film Electronics
Last Updated Date: 05/13/2015

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/12/2015

The Advanced Dimensional Measurement Systems for Manufacturing (ADMSM) project provides the measurement science and infrastructure needed by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/11/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Nanoelectronic Device Metrology
Last Updated Date: 05/11/2015

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Agility Performance of Robotic Systems
Last Updated Date: 05/06/2015

The application of robotics in manufacturing assembly is hindered by their lack of agility, their large changeover times for new tasks and new … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 05/05/2015

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 05/05/2015

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

CMOS Device and Reliability
Last Updated Date: 05/05/2015

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Forensic Topography and Surface Metrology
Last Updated Date: 05/04/2015

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

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