NIST logo
NIST Home > Manufacturing Programs and Projects 
 

Manufacturing Programs & Projects

(showing 46 - 60 of 98)
Advanced Metering in Smart Distribution Grids
Last Updated Date: 01/24/2014

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Industrial Ethernet Network Performance (IENetP)
Last Updated Date: 01/08/2014

Develop metrics, tests, and tools to determine and report the network performance of industrial Ethernet devices in a standardized way.

Commissioning Building Systems for Improved Energy Performance Project
Last Updated Date: 12/12/2013

NIST will advance commercial building system commissioning as a standard quality assurance practice by developing techniques to automate … more

SCORE (System, Component and Operationally Relevant Evaluations)
Last Updated Date: 11/26/2013

SCORE (System, Component and Operationally Relevant Evaluations) is a unified set of criteria and software tools for defining a performance … more

Ceramic Phase Equilibrium Data
Last Updated Date: 10/24/2013

Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as … more

SI Length and Traceability
Last Updated Date: 08/01/2013

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

High Rate Tensile Testing
Last Updated Date: 07/02/2013

High rate tensile testing summary pending

Thin Film Electronics
Last Updated Date: 07/01/2013

The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as … more

In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM
Last Updated Date: 06/28/2013

Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and operation of active nanostructures is … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/08/2013

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/03/2013

The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more

Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013

Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 04/11/2013

The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more

Related Links in:Physical Measurement Laboratory 
Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070