Manufacturing Programs & Projects | |
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International System of Units (SI)
Last Updated Date: 01/13/2011 The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more
Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010 High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more
Wireless Systems Metrology
Last Updated Date: 10/05/2010 Imagine how much safer a fire fighter's job would be if it were possible for a robot to navigate in a burning building and locate those in … more
Super-resolution Optical Microscopy
Last Updated Date: 10/05/2010 As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more |
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