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Publication Citation: 10 TOhm and 100 TOhm High Resistance Measurements at NIST

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Author(s): Dean G. Jarrett; Marlin E. Kraft;
Title: 10 TOhm and 100 TOhm High Resistance Measurements at NIST
Published: September 25, 2013
Abstract: The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple paths from 1 TΩ to the higher levels of resistance. Settling times, voltage coefficients, drift rates, and temperature coefficients of the resistance standards were determine to evaluate the extension of high resistance measurements at NIST beyond the 1 TΩ level of resistance.
Proceedings: 10th International Seminar on Electrical Metrology (X Semetro)
Location: Buenos Aires, -1
Dates: September 25-27, 2013
Keywords: standard resistor, guarded Hamon transfer standard, settling time, scaling, measurements
Research Areas: Electronics & Telecommunications, Electrical Quantities
PDF version: PDF Document Click here to retrieve PDF version of paper (547KB)