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Microelectromechanical Systems (MEMS) Information at NIST

  • A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices

  • CNST Releases the Spring 2012 Edition of The CNST News

  • CNST Releases the Summer 2012 Edition of The CNST News

  • CNST Releases the Winter 2012 Edition of The CNST News

  • Is Your Microrobot Up for the (NIST) Challenge?

  • Jonathan Moreyra

  • MEMS Measurement Science and Standards

  • Micro Rheometer is Latest Lab On a Chip Device

  • Nanofluidics of MEMS and NEMS

  • Nanoscale and Quantum Metrology

  • Nanoscale Strength Measurements and Standards

  • Nanoscale Stress Measurements and Standards

  • Nanowire Position and Orientation Precisely Controlled Using Fluid Flow

  • New Magnetic-Field-Sensitive Alloy Could Find Use in Novel Micromechanical Devices

  • New Method Measures Movements of Tiny Devices-At Every Step

  • New NIST Measurement Tool Is On Target for the Fast-Growing MEMS Industry

  • New Platform Developed to Measure and Exploit Optomechanical Interactions

  • New Temporal Filtering Technique Improves Solid-State Single Photon Sources

  • NIST Develops Test Method for Key Micromechanical Property

  • Optical MEMS and NEMS

  • Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy

  • Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices

  • Researchers Validate Simplified Lateral Force Calibration Technique for Atomic Force Microscopy

  • Strain fields and phase distribution maps of indented Si

  • Systems Integration

  • Tiny Levers, Big Moves in Piezoelectric Sensors

  • Tiny Levers, Big Moves in Piezoelectric Sensors --Description for the Visually Impaired

  • Vladimir Aksyuk