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Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 33)
International System of Units (SI)
Last Updated Date: 09/25/2015

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

Dimensional Measurement Services
Last Updated Date: 09/11/2015

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 09/08/2015

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/08/2015

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/08/2015

The project focuses on significant metrology challenges that impede the advancement of high-performance optical and photonic systems. We develop, … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/08/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/08/2015

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 09/08/2015

The Advanced Dimensional Measurement Systems for Manufacturing (ADMSM) project provides the measurement science and infrastructure needed by … more

SI Length and Traceability
Last Updated Date: 09/08/2015

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

Aperture area measurements
Last Updated Date: 08/17/2015

Radiometric and photometric measurements require defining apertures. The accuracy to which these measurements can be accomplished requires … more

Thin Film Electronics
Last Updated Date: 06/30/2015

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

CMOS Device and Reliability
Last Updated Date: 06/12/2015

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Systems Integration for Additive Manufacturing
Last Updated Date: 05/26/2015

Numerous research efforts are underway to reduce the time and improve the quality of the product realization process for additive manufacturing. A … more

Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 05/19/2015

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 05/19/2015

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

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