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Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 40)
SI Length and Traceability
Last Updated Date: 05/21/2015

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 05/19/2015

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 05/19/2015

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Thin Film Electronics
Last Updated Date: 05/13/2015

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/12/2015

The Advanced Dimensional Measurement Systems for Manufacturing (ADMSM) project provides the measurement science and infrastructure needed by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/11/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 05/05/2015

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 05/05/2015

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

CMOS Device and Reliability
Last Updated Date: 05/05/2015

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Forensic Topography and Surface Metrology
Last Updated Date: 05/04/2015

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/23/2015

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Dimensional Measurement Services
Last Updated Date: 04/16/2015

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Redefinition of the Kilogram
Last Updated Date: 03/25/2015

This project will conduct the research and development required to support the international efforts to prepare for a future redefinition of the … more

Small Force Metrology
Last Updated Date: 03/25/2015

The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more

Uniform Realization of the Unit of Torque in the US
Last Updated Date: 03/25/2015

Torque measurements are used heavily during product assembly and testing throughout the aerospace, automotive, and manufacturing sectors. … more

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