Manufacturing Metrology Programs & Projects | |
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Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 05/09/2013 We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more
Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/08/2013 Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more
Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/03/2013 The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more
Fundamental Measurement Science for Additive Processes Project
Last Updated Date: 04/30/2013 Additive manufacturing (AM) processes have great potential for making high-value, complex, individually-customized parts, but several technical … more
Three-Dimensional Nanometer Metrology
Last Updated Date: 04/30/2013 Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more
Dimensional Measurement Services
Last Updated Date: 04/23/2013 The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more
SI Length and Traceability
Last Updated Date: 04/19/2013 In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more
Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013 Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more
Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013 A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more
Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013 Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more
CMOS Device and Reliability
Last Updated Date: 04/11/2013 The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more
Thin Film Electronics
Last Updated Date: 04/08/2013 The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as … more
Dexterous Manipulation for Part Grasping and Assembly
Last Updated Date: 04/04/2013 This project will investigate new measurement science to gauge the operational characteristics of manipulation at both the macro and micro … more
Nanoscale Stress Measurements and Standards
Last Updated Date: 03/15/2013 Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more
Crystallographic Databases
Last Updated Date: 03/13/2013 Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more |
Contact
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