NIST logo
NIST Home > Manufacturing Metrology Programs and Projects 
 

Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 23)
Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 05/04/2016

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 05/04/2016

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Smart Manufacturing Operations Planning and Control Program
Last Updated Date: 05/04/2016

The Smart Manufacturing Operations Planning and Control Program will develop and deploy advances in measurement science that enable performance, … more

Thin Film Electronics
Last Updated Date: 04/25/2016

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Digital Thread for Smart Manufacturing
Last Updated Date: 04/25/2016

The Digital Thread for Smart Manufacturing Systems project will deliver methods and protocols that extend and complete the digital thread for … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 04/22/2016

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 03/18/2016

The Advanced Dimensional Measurement Systems for Manufacturing (ADMSM) project provides the measurement science and infrastructure needed by … more

Forensic Topography and Surface Metrology
Last Updated Date: 02/17/2016

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Systems Integration for Additive Manufacturing
Last Updated Date: 01/08/2016

Numerous research efforts are underway to reduce the time and improve the quality of the product realization process for additive manufacturing. A … more

SI Length and Traceability
Last Updated Date: 12/01/2015

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

Ceramic Phase Equilibrium Data
Last Updated Date: 10/14/2015

Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as … more

International System of Units (SI)
Last Updated Date: 09/25/2015

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

Dimensional Measurement Services
Last Updated Date: 09/11/2015

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/08/2015

The project focuses on significant metrology challenges that impede the advancement of high-performance optical and photonic systems. We develop, … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/08/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070