The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more
Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more
The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more
The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging … more
This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more
This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more
NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics
NIST Polishes Method for Creating Tiny Diamond Machines
NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
New Wave: Spin Soliton Could Be a Hit in Cell Phone Communication
A high-bandwidth electromagnetic MEMS motion stage for scanning applications
In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition
In Situ Gas Phase Measurements During Metal Alkylamide Atomic Layer Deposition
General Information: 301-975-NIST (6478) inquiries@nist.gov
100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070
