Microelectronics News | |
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NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics
Release Date: 10/16/2012 The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a … more
Three NIST Researchers Earn Presidential Honor
Release Date: 07/25/2012 The White House has announced that three researchers at the National Institute of Standards and Technology (NIST) will receive the 2011 … more
Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012 In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more
CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials
Release Date: 02/15/2012 Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent … more
NIST Polishes Method for Creating Tiny Diamond Machines
Release Date: 09/27/2011 Diamonds may be best known as a symbol of long-lasting love. But semiconductor makers are also hoping they'll pan out as key components of … more
New Wave: Spin Soliton Could Be a Hit in Cell Phone Communication
Release Date: 09/14/2010 Researchers at the National Institute of Standards and Technology (NIST) have found theoretical evidence* of a new way to generate the … more
Is Your Microrobot Up for the (NIST) Challenge?
Release Date: 10/20/2009 The scientists and engineers who introduced the world to tiny robots demonstrating soccer skills are creating the next level of friendly … more
Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games
Release Date: 06/16/2009 T he National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - … more
NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008 Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more
Bottoms Up: Better Organic Semiconductors for Printable Electronics
Release Date: 09/03/2008 Researchers from the National Institute of Standards and Technology (NIST) and Seoul National University (SNU) have learned how to tweak a new … more
‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008 Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, … more
Exposing the Sensitivity of Extreme Ultraviolet Photoresists
Release Date: 06/24/2008 Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation … more
Making a Good Impression: Nanoimprint Lithography Tests at NIST
Release Date: 04/29/2008 In what should be good news for integrated circuit manufacturers, recent studies by the National Institute of Standards and Technology (NIST) have … more
NIST Team Proves Bridge from Conventional to Molecular Electronics Possible
Release Date: 03/18/2008 Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the “evolutionary … more
Micro Microwave Does Pinpoint Cooking for Miniaturized Labs
Release Date: 11/08/2007 Researchers at the National Institute of Standards and Technology (NIST) and George Mason University have demonstrated what is probably the … more |
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