Microelectronics Programs & Projects | |
|
(showing 1 - 7 of 7)
Magnetodynamics and Spin Electronics
Last Updated Date: 05/13/2013 The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more
MEMS Measurement Science and Standards
Last Updated Date: 05/09/2013 Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more
CMOS Device and Reliability
Last Updated Date: 04/11/2013 The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more
Nanoelectronic Device Metrology
Last Updated Date: 04/09/2013 The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging … more
High Speed Electronics
Last Updated Date: 03/25/2013 This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more
Thin Film and Interconnect Reliability
Last Updated Date: 01/04/2013 This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more
COMPLETED: Dimensional Metrology for Nanoscale Patterns
Last Updated Date: 10/02/2012 Our goal is to develop and demonstrate precise measurement methods that quantify the physical shape, critical dimensions (CD) and … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |