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Microelectronics Programs & Projects

(showing 1 - 8 of 8)
Nanoelectronic Device Metrology
Last Updated Date: 06/24/2015

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

CMOS Device and Reliability
Last Updated Date: 06/12/2015

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Magnetodynamics and Spin Electronics
Last Updated Date: 06/08/2015

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

Micro- and Nanoelectromechanical Systems
Last Updated Date: 05/26/2015

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical … more

Thin Film and Interconnect Reliability
Last Updated Date: 01/28/2015

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

High Speed Electronics
Last Updated Date: 11/28/2014

This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more

Genomics of Electronic Materials
Last Updated Date: 11/20/2014

Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and … more

COMPLETED: Dimensional Metrology for Nanoscale Patterns
Last Updated Date: 04/17/2014

Our goal is to develop and demonstrate precise measurement methods that quantify the physical shape, critical dimensions (CD) and the structure of … more

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