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Purpose:CL 2011 will bring together international expertise in the application of CL techniques to a wide variety of materials. CL techniques enable impurity and defect microstructures to be investigated with high sensitivity and resolution. The TC will feature sessions on CL theory, practice and the correlative analysis with CL with complementary techniques. There will be presentations by students and professionals. This conference is recommended for experts and novices alike. Conference Web site:http://www.microbeamanalysis.org/topical-conferences/cl-2011/index.htm |
Details: Start Date: Monday, October 24, 2011
End Date: Friday, October 28, 2011
Location: AML Complex
Audience: Industry, Government, Academia
Format: Conference
Sponsor(s):Registration:Registration will be limited to 80 participants. NIST is a secure facility and no walk up registrations will be possible. All attendees must fill out the online registration form and non-Us citizens will be asked for additional information. Professional MAS/AMAS Members $300Professional Non-members $375 Students $150 Registration Contact: Scott Wight
scott.wight@nist.gov
301-975-3949
Accommodations:A room block (one King bed and sofa bed) has been reserved under the name "NIST Workshop" for $169/night at the: Courtyard by Marriott at Washingtonian Center/Rio - reserve online use group code: NWRNWRACourtyard Gaithersburg Washingtonian Center 204 Boardwalk Place · Gaithersburg, MD 20878 USA
Phone: 1-301-527-9000Fax: 1-301-527-9001US & Canada Toll Free 1-888-236-2427Technical Contact: Scott Wight
scott.wight@nist.gov
301-975-3949
Vendor Contact: Scott Wight
scott.wight@nist.gov
301-975-3949
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