Dr. James Cline

Research Interests

• X-ray wavelength and metrology for SI Traceable Measurements on Powder and Thin Film Structures

• Standard Reference Materials to Address Measurement Issues of X-ray Wavelength Scattering Experiments

• Rigorous Evaluation of Hardware and Software of the used by X-ray Wavelength Scattering Community

Figure 1 (left):Ceramics Division Divergent Beam Diffractometer (CDDBD) configured with Johansson incident beam monochromator.; Figure 2 (right): Suite of SRMs certified for calibration of diffraction measurements from powder and thin film structures.

Figure 3: X-ray Optics Evaluation Double Crystal Diffractometer (XOEDCD) configured for characterization of the performance graded parabolic X-ray mirrors.

Postdoctoral Research Opportunities in Diffraction Metrology & Standards 

The production of Standard Reference Materials, which allow for calibration of measurements from powder diffractometers, requires knowledge of the fundamental parameters that determine the observed data. Our goals are to quantify those parameters that contribute to instrument profile functions and to establish baselines for instrument performance. Opportunities exist for both model development (theory and programming of algorithms) and instrumentation (construction, optimization, calibration, and automation of equipment).  For more information...

X-ray reflectometry (XRR) is used to characterize the thickness, density, and roughness of thin, nearly-smooth, deposited films, particularly in the microelectronics industry. XRR modeling is essential to interpreting XRR data.  Opportunities exist for both model development (theory and programming of algorithms) and instrumentation (construction, optimization, calibration, and automation of equipment).  For more information...

High-Resolution X-Ray Diffraction (HRXRD) is a powerful technique for characterizing epitaxial crystalline layers as used in many electronic, magnetic, and optical technologies. There are two distinct research areas for HRXRD measurements. One involves quantifying and optimizing the performance of the focusing optics needed for the technique. Another topic is modeling of HRXRD data, which requires dynamical scattering theory to interpret interference effects between epitaxial films and substrates  Opportunities exist for both model development (theory and programming of algorithms) and for instrumentation (construction, optimization, calibration, and automation of equipment).  For more information...

Awards and Honors

• Fellow, International Centre for Diffraction Data, 2008

• Judson C. French Award, NIST, 2005