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Mid-Atlantic Microbeam Analysis Society 2012 Symposium


A one-half day symposium on the advances to the field in the last 20 years that would have been of great interest to our colleague and friend Chuck Fiori.


“20 Years After Chuck: Progress in Microbeam Analysis Along Fiori’s Trajectories”


1:00 PM Welcome and Opening Remarks: John A. Small (Chief, Surface and Microanalysis Science Division, National Institute of Standards and Technology)

1: 15 - 1:50 Dale E. Newbury (NIST)

“Elemental Mapping with the Silicon Drift Detector EDS: Useful Maps in Seconds; the Impossible in 30 minutes”

1:55 – 2:30 Nicholas W. M. Ritchie (NIST)

“How can we help the SEM-EDS community to make better measurements?” 

2:35 – 3:10 Edward Vicenzi (Smithsonian Institution)

“A Microscopy  and Microanalytical Examination of Mid-19th Century Photographs”

3:15 – 3:50 Richard Leapman (National Institutes of Health)

"Development of EELS microanalysis in the biomedical sciences"


Start Date: Friday, September 14, 2012
End Date: Friday, September 14, 2012
Location: AML Complex Conference Room
Audience: Industry, Government, Academia
Format: Symposium


Surface and Microanalysis Science Division

Mid-Atlantic Microbeam Analysis Society


There is no registration fee but registration will be limited to 80 participants.  NIST is a secure facility and no walk up registrations will be possible.  All attendees including NIST employees must send an e-mail to and indicate if a US citizen.  Non-US citizens will be asked for additional information to process their registration.

Registration Contact:

Symposium Organizers

Dale Newbury,, 301-975-3921
Scott Wight,, 301-975-3949
Abby Lindstrom,, 301-975-5172