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Environmental Scanning Electron Microscope


FEI Company, Model Quanta 200 F Field Emission Scanning Electron Microscope

Specifications / Capabilities:

Field emission gun, high vacuum, low vacuum and environmental vacuum mode capable. Energy dispersive silicon drift x-ray detector, cathodoluminescence system, backscattered electron detector, peltier cooled stage, scanning transmission detector, wet scanning transmission detector, large field detector, gaseous analytical detector, gaseous backscatter detector, low vacuum and low voltage cones, and gaseous secondary electron detector.

Access Information:

Contact Scott Wight

Environmental Scanning Electron Microscope (ESEM)
Credit: NIST

Operating Schedule:

By Appointment


Name: Scott Wight
Phone: 301-975-3949
Email: scott.wight@nist.gov
100 Bureau Drive
Gaithersburg MD 20899-8371