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Scott Wight has been a Research Chemist in the Microanalysis Group of the Surface and Microanalysis Science Division at NIST since 1989. He received his thesis masters from the University of Maryland at College Park in Analytical/Nuclear/Environmental Chemistry in December, 1989. He received his BS in Chemistry from the State University of New York at Plattsburgh in 1986.
Scott’s research interests include fundamental measurements of electron induced x-ray specimen interactions, characterization and modeling of the primary electron scattering by gas molecules and its effect on quantitation in the environmental scanning electron microscope, and quantitation by Auger electron spectroscopy.
He is active in ISO and ASTM and currently serves at 1st vice chair for ASTM committee E42 on Surface Analysis and secretary for the Auger electron spectroscopy subcommittee of the ISO TC 201 committee on surface chemical analysis. He has been a member of the Microbeam Analysis Society since 1990 where he served as membership services chair for 3 years and has been a member of the computer activites committee since 2002 and chair of that committee for the last two years.
Surface and Microanalysis Science
Microanalysis Research Group