NIST Home > MML > Materials Measurement Science Division > Analytical Microscopy Group > Public Safety and Security in Analytical Microscopy Group
| * |
|
Public Safety and Security in Analytical Microscopy Group
Summary:
Reliable standards are needed to test, maintain, and improve the effectiveness of trace detectors that protect the public, commerce, and infrastructure of the United States. Currently, the NIST Surface & Microanalysis Science Division has an active program in trace detection metrology using state-of-the-art microanalytical instrumentation and ion mobility spectrometers. This program is designed to meet the measurement quality needs of organizations and agencies that use such detectors, which include the Transportation Security Agency, the Office of Law Enforcement Standards, the State Department, the Department of Defense, and the Department of Homeland Security.
Description:See above Major Accomplishments: |
 Start Date:February 4, 2003End Date:ongoingLead Organizational Unit:mmlSource of Extramural Funding:NIST Office of Law Enforcement Standards (OLES) The Science & Technology Directorate of the U.S. Department of Homeland Security Transportation Security Laboratory of the U.S. Department of Homeland Security Customers/Contributors/Collaborators:Transportation Security Laboratory Facilities/Tools Used:JetLab Precision Nanodeposition System Staff:Lenny Demoranville Laura Bell
Related Programs and Projects:ACD (MacCrehan) Trace Program Associated Products:ASTM Standards |