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Structure Determination Methods Group
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Welcome
The Structure Determination Methods Group develops and disseminates measurement science, standards, and technology for the determination of the structures of advanced materials via: standard reference materials; standard reference databases; X-ray, electron, and neutron diffraction methods; synchrotron and neutron scattering methods; and computational tools. The Group’s activities are carried out in five project areas: Diffraction Metrology, Thin Film X-ray Reflectometry, Local Structure, Phase Equilibrium Data, and Crystallographic Databases. Programs/Projects
Crystallographic Databases—Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured from crystalline materials. The development of … Ceramic Phase Equilibrium Data—Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as telecommunications and energy. The objective of this … Thin Film X-Ray Reflectometry—Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to enable accurate measurement of film thickness, … Measurement and Prediction of Local Structure —Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials for electronic applications. Under this project, we … |
Highlights
Contact
Structure Determination Methods Group
Terrell Vanderah, Group Leader 100 Bureau Drive, M/S 8520 Gaithersburg, MD 20899 301-975-5785 Telephone 301-975-5334 Facsimile |