NIST logo
NIST Home > Nanotechnology Programs and Projects 
 

Nanotechnology Programs & Projects

(showing 1 - 15 of 145)
Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 10/01/2014

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Quantum Information and Measurements
Last Updated Date: 09/30/2014

America's future prosperity and security may rely in part on the exotic properties of quantum mechanics. Research on quantum information (QI) … more

Quantum Materials and Devices
Last Updated Date: 09/30/2014

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Quantum Voltage System Development and Dissemination
Last Updated Date: 09/30/2014

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Dimensional Metrology for Nanofabrication
Last Updated Date: 09/30/2014

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

Nanotube Metrology
Last Updated Date: 09/29/2014

Nanotube metrology improvement is a significant effort in the Particles, Tubes and Colloids project dedicated to improving the measurement methods … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 09/29/2014

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

MEMS Measurement Science and Standards
Last Updated Date: 09/29/2014

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Nanoparticle Measurements and Standards for Biomedical Applications and Health
Last Updated Date: 09/22/2014

Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical … more

nanotubes
Scanning electron microscope image of typical titania nanotubes for a photocatalytic cell to produce hydrogen gas from water.
Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070