Journal of Research Volume 100

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

Preparation and Calibration of Carrier-Free ²⁰⁹Po Solution Standards, p. 1
R. Collé, Zhichao Lin, F. J. Schima, P. A. Hodge, J. W. L. Thomas, J. M. R. Hutchinson, and B. M. Coursey
http://dx.doi.org/10.6028/jres.100.002

Spectral Radiance of a Large-Area Integtrating Sphere Source, p. 37
James H. Walker and Ambler Thompson
http://dx.doi.org/10.6028/jres.100.003

Deposition of Diamond Films in a Closed Hot Filament CVD System, p. 43
Guan-Ren Lai, E. N. Farabaugh, A. Feldman, and L. H. Robins
http://dx.doi.org/10.6028/jres.100.004

Variances in the Measurement of Ceramic Powder Properties, p. 51
R. G. Munro, S. G. Malghan, and S. M. Hsu
http://dx.doi.org/10.6028/jres.100.005

On the Applications of Discontinuous Bessel Integrals to Chronoamperometry, p. 61
William T. Yap, and Richard A. Durst
http://dx.doi.org/10.6028/jres.100.006

Third International Conference on Information and Knowledge Management (CIKM-94), p. 67
Elizabeth Fong, Shirley Hurwitz, and Yelena Yesha
http://dx.doi.org/10.6028/jres.100.007

Federal Wireless Users' Forum Workshop, p. 71
Mary K. Ruhl and Tish Antonishek
http://dx.doi.org/10.6028/jres.100.008

Workshop on Water: Its Measurement and Control in Vacuum, p. 75
Stuart A. Tison and J. Patrick Looney
http://dx.doi.org/10.6028/jres.100.009

Manufacturing Technology Conference: Toward a Common Agenda, p. 83
Joseph Hungate
http://dx.doi.org/10.6028/jres.100.010

Low-Temperature Properties of Silver, p. 119
David R. Smith and F. R. Fickett
http://dx.doi.org/10.6028/jres.100.012

Mixing Plate-Like and Rod-Like Molecules With Solvent: A Test of Flory-Huggins Lattice Statistics, p. 173
Edmund A. Di Marzio, Arthur J. M. Yang, and Sharon C. Glotzer
http://dx.doi.org/10.6028/jres.100.013

Determining the Magnetic Properties of 1 kg Mass Standards, p. 209
Richard S. Davis
http://dx.doi.org/10.6028/jres.100.015

1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany), p. 227
Yoshihiro Ohno and Georg Sauter
http://dx.doi.org/10.6028/jres.100.016

Determination of the Transmittance Uniformity of Optical Filter Standard Reference Materials, p. 241
J. C. Travis, N. K. Winchester, and M. V. Smith
http://dx.doi.org/10.6028/jres.100.017

Low-Frequency Model for Radio-Frequency Absorbers, p. 257
J. Randa
http://dx.doi.org/10.6028/jres.100.018

Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effet Sample, p. 269
M. E. Cage and C. F. Lavine
http://dx.doi.org/10.6028/jres.100.019

High Accuracy Measurement of Aperture Area Relative to a Standard Known Aperture, p. 277
Joel B. Fowler and Gyula Dezsi
http://dx.doi.org/10.6028/jres.100.020

Letter to the Editor New IUPAC guidelines for the reporting of stable hydrogen, carbon, and oxygen isotope-ratio data, p. 285
Tyler B. Coplen
http://dx.doi.org/10.6028/jres.100.021

Quest for Excellence VII- Conference Report, p. 287
Cap Frank and Robert E. Chapman
http://dx.doi.org/10.6028/jres.100.022

17th National Computer Security Conference- Conference Report, p. 301
Dennis Gilbert
http://dx.doi.org/10.6028/jres.100.023

The Gaseous Electronics Conference RF Reference Cell–An Introduction, p. 327
J. K. Olthoff and K. E. Greenberg
http://dx.doi.org/10.6028/jres.100.025

Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell, p. 341
Mark A. Sobolewski
http://dx.doi.org/10.6028/jres.100.026

Optical Emission Spectroscopy on the Gaseous Electronics Conference RF Reference Cell, p. 353
J. R. Roberts
http://dx.doi.org/10.6028/jres.100.027

Optical Diagnostics in the Gaseous Electronics Conference RF Reference Cell, p. 373
G. A. Hebner and Kenneth E. Greenberg
http://dx.doi.org/10.6028/jres.100.028

Studies of Ion Kinetic-Energy Distributions in the Gaseous Electronics Conference RF Reference Cell, p. 383
J. K. Olthoff, R. J. Van Brunt, and S. B. Radovanov
http://dx.doi.org/10.6028/jres.100.029

Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell, p. 401
Lawrence J. Overzet
http://dx.doi.org/10.6028/jres.100.030

Langmuir Probe Measurements in the Gaseous Electronics Conference RF Reference Cell, p. 415
M. B. Hopkins
http://dx.doi.org/10.6028/jres.100.031

An Inductively Coupled Plasma Source for the Gaseous Electronics Conference RF Reference Cell, p. 427
Paul A. Miller, Gregory A. Hebner, Kenneth E. Greenberg, Paul D. Pochan, and Ben P. Aragon
http://dx.doi.org/10.6028/jres.100.032

Reactive Ion Etching in the Gaseous Electronics Conference RF Reference Cell, p. 441
M. L. Brake, J. T. P. Pender, M. J. Buie, A. Ricci, J. Soniker, P. D. Pochan, and P. A. Miller
http://dx.doi.org/10.6028/jres.100.033

Dusty Plasma Studies in the Gaseous Electronics Conference RF Reference Cell, p. 449
H. M. Anderson and S. B. Radovanov
http://dx.doi.org/10.6028/jres.100.034

One-Dimensional Modeling Studies of the Gaseous Electronics Conference RF Reference Cell, p. 463
T. R. Govidan and M. Meyyappan
http://dx.doi.org/10.6028/jres.100.035

Two-Dimensional Self-Consistent Radio Frequency Plasma Simulations Relevant to the Gaseous Electronics Conference RF Reference Cell, p. 473
Dimitris P. Lymberopoulos and Demetre J. Economou
http://dx.doi.org/10.6028/jres.100.036

Forty-Seventh Annual Gaseous Electronics Conference- Conference Report, p. 495
Richard J. Van Brunt and Jean W. Gallagher
http://dx.doi.org/10.6028/jres.100.037

Low Electrolytic Conductivity Standards, p. 521
Yung Chi Wu and Paula A. Berezansky
http://dx.doi.org/10.6028/jres.100.039

Potential and Current Distributions Calculated Across a Quantum Hall Effet Sample at Low and High Currents, p. 529
M. E. Cage and C. F. Lavine
http://dx.doi.org/10.6028/jres.100.040

Microform Calibration Uncertainties of Rockwell Diamond Indenters, p. 543
J. F. Song, F. F. Rudder, Jr., T. V. Vorburger, and J. H. Smith
http://dx.doi.org/10.6028/jres.100.041

Performance Measures for Geometric Fitting in the NIST Algorithm Testing and Evaluation Program for Coordinate Measurement Systems, p. 563
Theodore H. Hopp and Mark S. Levenson
http://dx.doi.org/10.6028/jres.100.042

A Study on the Reuse of Plastic Concrete Using Extended Set-Retarding Admixtures, p. 575
Colin Lobo, William F. Guthrie, and Raghu Kacker
http://dx.doi.org/10.6028/jres.100.043

A Third Generation Water Bath Based Blackbody Source, p. 591
Joel B. Fowler
http://dx.doi.org/10.6028/jres.100.044

COMPASS '95 Tenth Annual Conference on Computer Assurance- Conference Report, p. 601
Bonnie P. Danner, Laura M. Ippolito, and Dolores R. Wallace
http://dx.doi.org/10.6028/jres.100.045

Calibration of Electret-Based Integral Radon Monitors Using NIST Polyethylene-Encapsulated ²²⁶Ra/²²²Rn Emanation (PERE) Standards, p. 629
R. Collé, P. Kotrappa, and J. M. R. Hutchinson
http://dx.doi.org/10.6028/jres.100.047

Microstructural Characterization of Cobalt-Tungsten Coated Graphite Fibers, p. 641
N. S. Wheeler
http://dx.doi.org/10.6028/jres.100.048

On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem, p. 661
J. F. Marchiando
http://dx.doi.org/10.6028/jres.100.049

Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections, p. 677
A. Jeffery, R. E. Elmquist, and M. E. Cage
http://dx.doi.org/10.6028/jres.100.050

Analysis of the (5d²+5d6s)-5d6p Transition Arrays of Os VII and Ir VIII, and the 6s ²S-6p ²P Transitions of Ir IX, p. 687
G. J. van het Hof, Y. N. Joshi, J. F. Wyart, and J. Sugar
http://dx.doi.org/10.6028/jres.100.051

Application Portability Profile and Open System Environment User's Forum- Conference Report, p. 699
Joseph I. Hungate, Martha M. Gray, and Kathleen A. Liburdy
http://dx.doi.org/10.6028/jres.100.052

International Workshop on Semiconductor Characterization: Present Status and Future Needs- Conference Report, p. 711
D. G. Seiler and T. J. Shaffner
http://dx.doi.org/10.6028/jres.100.053

Metrology Issues in Terahertz Physics and Technology- Conference Report, p. 717
Raju Datla, Erich Grossman, and Mitchell K. Hobish
http://dx.doi.org/10.6028/jres.100.054

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 100

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 1995

Issue 2 March-April 1995

Issue 3 May-June 1995

Issue 4 July-August 1995

Issue 5 September-October 1995

Issue 6 November-December 1995

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