Journal of Research Volume 101

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

An International Marine-Atmospheric 222-Rn Measurement Intercomparison in Bermuda Part I: NIST Calibration and Methodology for Standardized Sample Additions, p. 1
R. Colle, M. P. Unterweger, P. A. Hodge, and J. M. R. Hutchinson
http://dx.doi.org/10.6028/jres.101.005

An International Marine-Atmospheric 222-Rn Measurement Intercomparison in Bermuda Part II: Results for the Participating Laboratories, p. 21
R. Colle, M. P. Unterweger, J. M. R. Hutchinson, S. Whittlestone, Georges Polian, Benedicte Ardouin, Jack G. Kay, James P. Friend, Byron W. Blomquist, Wolfgang Nadler, Thomas T. Dang, R. J. Larsen, an A. R. Hutter
http://dx.doi.org/10.6028/jres.101.006

Theory of Electron Beam Moire, p. 47
David R. Read and James W. Dally
http://dx.doi.org/10.6028/jres.101.007

50th Calorimetry Conference- Conference Report, p. 63
Eugene S. Domalski, Robert N. Goldberg, and Patrick A. G. O'Hare
http://dx.doi.org/10.6028/jres.101.008

Second Workshop on Industrial Applications of Scanned Probe Microscopy, p. 69
John A. Dagata, Alain C. Diebold, C. K. Ken Shih, and Richard J. Colton
http://dx.doi.org/10.6028/jres.101.009

International Workshop on Instrumented Indentation, p. 77
Douglas T. Smith
http://dx.doi.org/10.6028/jres.101.010

Manufacturing Technology Conference: Toward a Common Agenda, p. 83
David C. Stieren
http://dx.doi.org/10.6028/jres.101.011

Workshop on Planning for Compound Semiconductor Technology, p. 89
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.101.012

The NIST Detector-Based Luminous Intensity Scale, p. 109
C. L. Cromer, G. Eppeldauer, J. E. Hardis, T. C. Larason, Y. Ohno, and A. C. Parr
http://dx.doi.org/10.6028/jres.101.014

The NIST High Accuracy Scale for Absolute Spectral Response from 406 nm to 920 nm, p. 133
T. C. Larason, S. S. Bruce, and C. L. Cromer
http://dx.doi.org/10.6028/jres.101.015

Irradiance of Horizontal Quartz-Halogen Standard Lamps, p. 141
Edward A. Early and Ambler Thompson
http://dx.doi.org/10.6028/jres.101.016

Development of the Ion Exchange-Gravimetric Method for Sodium in Serum as a Definitive Method, p. 155
John R. Moody and Thomas W. Vetter
http://dx.doi.org/10.6028/jres.101.017

The MasPar MP-1 As a Computer Arithmetic Laboratory, p. 165
Michael A. Anuta, Daniel W. Lozier, and Peter R. Turner
http://dx.doi.org/10.6028/jres.101.018

Evidence That Voltage Rather Than Resistance is Quantized in Breakdown of the Quantum Hall Effect, p. 175
M. E. Cage
http://dx.doi.org/10.6028/jres.101.019

Inorganic Crystal Structure Database (ICSD) and Standardized Data and Crystal Chemical Characterization of Inorganic Structure Types (TYPIX)–Two Tools for Inorganic Chemists and Crystallographers, p. 217
Ekkehard Fluck
http://dx.doi.org/10.6028/jres.101.022

Evaluation of Crystallographic Data with the Program DIAMOND, p. 221
Guenther Bergerhoff, Michael Berndt, and Klaus Brandenburg
http://dx.doi.org/10.6028/jres.101.023

The Cambridge Structural Database (CSD): Current Activities and Future Plans, p. 227
David G. Watson
http://dx.doi.org/10.6028/jres.101.024

The Protein Data Bank: Current Status and Future Challenges, p. 231
Enrique E. Abola, Nancy O. Manning, Jaime Prilusky, David R. Stampf, and Joel L. Sussman
http://dx.doi.org/10.6028/jres.101.025

The Nucleic Acid Database: Present and Future, p. 243
Helen M. Berman, Anke Gelbin, Lester Clowney, Shu-Hsin Hsieh, Christine Zardecki, and John Westbrook
http://dx.doi.org/10.6028/jres.101.026

The Powder Diffraction File: Past, Present, and Future, p. 259
Deane K. Smith and Ron Jenkins
http://dx.doi.org/10.6028/jres.101.027

NIST Crystallographic Databases for Research and Analysis, p. 273
Alan D. Mighell and Vicky Lynn Karen
http://dx.doi.org/10.6028/jres.101.028

Conventional and Eccentric Uses of Crystallographic Databases in Practical Materials Identification Problems, p. 281
James A. Kaduk
http://dx.doi.org/10.6028/jres.101.029

Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD Diffractometers, p. 295
Susan K. Byram, Charles F. Campana, James Fait, and Robert A. Sparks
http://dx.doi.org/10.6028/jres.101.030

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns, p. 301
R. P. Goehner and J. R. Michael
http://dx.doi.org/10.6028/jres.101.031

The Biological Macromolecule Crystallization Database and NASA Protein Crystal Growth Archive, p. 309
Gary L. Gilliland, Michael Tung, and Jane Ladner
http://dx.doi.org/10.6028/jres.101.032

Investigations of the Systematics of Crystal Packing Using the Cambridge Structural Database, p. 321
Carolyn Pratt Brock
http://dx.doi.org/10.6028/jres.101.033

Troublesome Crystal Structures: Prevention, Detection, and Resolution, p. 327
Richard L. Harlow
http://dx.doi.org/10.6028/jres.101.034

CIF (Crystallographic Information File): A Standard for Crystallographic Data Interchange, p. 341
I. D. Brown
http://dx.doi.org/10.6028/jres.101.035

The Role of Journals in Maintaining Data Integrity: Checking of Crystal Structure Data in Acta Crystallograhpica, p. 347
Brian McMahon
http://dx.doi.org/10.6028/jres.101.036

Electronic Publishing and the Journals of the American Chemical Society, p. 357
Jeffrey D. Spring and Lorrin R. Garson
http://dx.doi.org/10.6028/jres.101.037

How the Cambridge Crystallographic Data Centre Obtains its Information, p. 361
David G. Watson
http://dx.doi.org/10.6028/jres.101.038

Data Import and Validation in the Inorganic Crystal Structure Database, p. 365
H. Behrens
http://dx.doi.org/10.6028/jres.101.039

World Wide Web for Crystallography, p. 375
H. D. Flack
http://dx.doi.org/10.6028/jres.101.040

Workshop Highlights, p. 381
Karen, V.L.; Mighell, A.
http://dx.doi.org/10.6028/jres.101.041

Workshop on Characterizing Diamond Films IV- Conference Report, p. 383
Albert Feldmann, Ajay P. Malshe, and John E. Graebner
http://dx.doi.org/10.6028/jres.101.042

Quest for Excellence VIII- Conference Report, p. 387
Cap Frank
http://dx.doi.org/10.6028/jres.101.043

Very Cold Indeed: The Nanokelvin Physics of Bose-Einstein Condensation, p. 419
Eric Cornell
http://dx.doi.org/10.6028/jres.101.045

Methods for a Nonuniform Bose Gas, p. 435
Kerson Huang and Paolo Tommasini
http://dx.doi.org/10.6028/jres.101.046

Theory of Interacting Quantum Gases, p. 443
H. T. C. Stoof, M. Bijlsma, and M. Houbiers
http://dx.doi.org/10.6028/jres.101.047

Generalized Mean fields for Trapped Atomic Bose-Einstein Condensates, p. 457
N. B. Proukakis and K. Burnett
http://dx.doi.org/10.6028/jres.101.048

Effective Action Approach to Bose-Einstein Condensation of Ideal Gases, p. 471
Klaus Kirsten and David J. Toms
http://dx.doi.org/10.6028/jres.101.049

Cold Binary Atomic Collissions in a Light Field, p. 487
Paul S. Julienne
http://dx.doi.org/10.6028/jres.101.050

A Spectroscopic Determination of Scattering Lengths for Sodium Atom Collisions, p. 505
Eite Tiesenga, Carl J. Williams, Paul S. Julienne, Kevin M. Jones, Paul D. Lett, and William D. Phillips
http://dx.doi.org/10.6028/jres.101.051

Estimating Bounds on Collission Relaxation Rates of Spin-Polarized 87-Rb Atoms at Ultracold Temperatures, p. 521
Frederick H. Mies, Carl J. Williams, Paul S. Julienne, and Morris Kraus
http://dx.doi.org/10.6028/jres.101.052

The Condensate Wave Function of a Trapped Atomic Gas, p. 537
F. Dalfovo, L. Pitaevskii, and S. Stringari
http://dx.doi.org/10.6028/jres.101.053

Approximate Solutions of the Nonlinear Schroedinger Equation for Ground and Excited States of Bose-Einstein Condensates, p. 545
R. J. Dodd
http://dx.doi.org/10.6028/jres.101.054

Zero-Temperature, Mean-Field Theory of Atomic Bose-Einstein Condensates, p. 553
Mark Edwards, R. J. Dodd, Charles W. Calrk, and K. Burnett
http://dx.doi.org/10.6028/jres.101.055

Aspect Ratio Analysis for Ground States of Bosons in Anisotropic Traps, p. 567
Kirill N. Ilinski and Alexander Moroz
http://dx.doi.org/10.6028/jres.101.056

Near-Resonant Imaging of Trapped Cold Atomic Samples, p. 575
L. You and Maciej Lewenstein
http://dx.doi.org/10.6028/jres.101.057

Atomic Phase Conjugation From a Bose Condensate, p. 583
Elena V. Goldstein, Katja Plaettner, and Pierre Meystre
http://dx.doi.org/10.6028/jres.101.058

Why a Condensate Can Be Thought of a Having a Definite Phase, p. 593
S. M. Barnett, K. Burnett, and J. A. Vaccarro
http://dx.doi.org/10.6028/jres.101.059

NIST High Accuracy Reference Reflectometer-Spectrometer, p. 619
James E. Proctor and P. Yvonne Barnes
http://dx.doi.org/10.6028/jres.101.061

An Oil-Bath-Based 293 K to 473 K Blackbody Source, p. 629
Joel B. Fowler
http://dx.doi.org/10.6028/jres.101.062

Comparative High Voltage Impulse Measurement, p. 639
Gerald J. FitzPatrick and Edward F. Kelley
http://dx.doi.org/10.6028/jres.101.063

Ultrasonic Power Output Measurement by Pulsed Radiation Pressure, p. 659
Steven E. Fick and Franklin R. Breckenridge
http://dx.doi.org/10.6028/jres.101.064

Corrections for Wavelength Variations in Precision Interferometric Displacement Measurements, p. 671
Jack Stone, Steven D. Phillips, and Gary A. Mandolfo
http://dx.doi.org/10.6028/jres.101.065

Melting and Vaporization of the 1223 Phase in the System (Tl-Pb-Ba-Sr-Ca-Cu-O), p. 675
L. P. Cook, W. Wong-Ng, and P. Paranthaman
http://dx.doi.org/10.6028/jres.101.066

Improved Wavelengths and Energy Levels of Doubly-Ionized Argon (Ar III), p. 691
Victor Kaufman and Ward Whaling
http://dx.doi.org/10.6028/jres.101.067

NIST Tutorial/Workshop on Lattice Gas and Boltzmann Methods- Conference Report, p. 705
Nicos S. Martys
http://dx.doi.org/10.6028/jres.101.068

NIST Speciation Workshop, p. 707
M. K. Schultz, W. C. Burnett, K. G. W. Inn, J. W. L. Thomas, and Zhichao Lin
http://dx.doi.org/10.6028/jres.101.069

Intrinsic Capacitances and Inductances of Quantum Hall Effect Devices, p. 733
M. E. Cage and A. Jeffery
http://dx.doi.org/10.6028/jres.101.071

Optimally Toothed Apertures for Reduced Diffraction, p. 745
Eric L. Shirley and R. U. Datla
http://dx.doi.org/10.6028/jres.101.072

Bombardment Induced Electron-Capture Processes at Sodium Halide Surfaces, p. 755
Joseph Fine
http://dx.doi.org/10.6028/jres.101.073

Statistics and the Question of Standards, p. 779
Stephen M. Stigler
http://dx.doi.org/10.6028/jres.101.074

COMPASS '96 The Eleventh Annual Conference on Computer Assurance- Conference Report, p. 791
Karen Ferraiolo and Laura M. Ippolito
http://dx.doi.org/10.6028/jres.101.075

Workshop on Materials and Measurements for Wireless Communications- Conference Report, p. 797
Terrell A. Vanderah
http://dx.doi.org/10.6028/jres.101.076

Hygrothermal Effects on the Performance of Polymers and Polymeric Composites- Conference Report, p. 803
Martin Y. M. Chiang and Gregory B. McKenna
http://dx.doi.org/10.6028/jres.101.077

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 101

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 1996

Issue 2 March-April 1996

Issue 3 May-June 1996

Issue 4 July-August 1996

Issue 5 September-October 1996

Issue 6 November-December 1996

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