Journal of Research Volume 102

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination, p. 1
Z. L. Wang, D. van Heerden, D. Josell, and A. J. Shapiro
http://dx.doi.org/10.6028/jres.102.002

Optimum Design of a Ceramic Tensile Creep Specimen Using a Finite Element Method, p. 15
Z. Wang, C. K. Chiang, and T.-J. Chuang
http://dx.doi.org/10.6028/jres.102.003

Interlaboratory Comparison on High-Temperature Superconductor Critical-Current Measurements, p. 29
J. A. Wiejaczka and L. F. Goodrich
http://dx.doi.org/10.6028/jres.102.004

DNA Molecules as Standard Reference Materials I: Development of DNA Identification Sequences and Human Mitochondrial DNA Reference Sequences, p. 53
Keith McKenney, Joel Hoskins, Jingxiang Tian, and Prasad Reddy
http://dx.doi.org/10.6028/jres.102.005

Water Calorimetry: The Heat Defect, p. 63
Norman V. Klassen and Carl K. Ross
http://dx.doi.org/10.6028/jres.102.006

Extension of the NIST AC-DC Difference Calibration Service for Current to 100 kHz, p. 75
Joseph R. Kinard, Thomas E. Lipe, and Clifton B. Childers
http://dx.doi.org/10.6028/jres.102.007

Results of the NIST National Ball Plate Round Robin, p. 85
G. W. Caskey, S. D. Phillips, and B. R. Borchardt
http://dx.doi.org/10.6028/jres.102.008

The Sixth International Meeting on Chemical Sensors, p. 95
Howard H. Weetall
http://dx.doi.org/10.6028/jres.102.009

Configurational Entropy Approach to the Kinetics of Glasses, p. 135
Edmund A. Di Marzio and Arthur J. M. Yang
http://dx.doi.org/10.6028/jres.102.011

Entropy Theory and Glass Transition: A Test by Monte Carlo Simulation, p. 159
J. Baschnagel, M. Wolfgardt, W. Paul, and K. Binder
http://dx.doi.org/10.6028/jres.102.012

Entropy and Fragility in Supercooling Liquids, p. 171
C. A. Angell
http://dx.doi.org/10.6028/jres.102.013

Entropy Crises in Glasses and Random Heteropolymers, p. 187
Peter G. Wolynes
http;//dx.doi.org/10.6028/jres.102.014

Adam-Gibbs Formulation of Enthalpy Relaxation Near the Glass Transition, p. 195
Ian M. Hodge
http://dx.doi.org/10.6028/jres.102.015

Evidence for Glass and Spin-Glass Phase Transitions From the Dynamic Susceptibility, p. 207
D. Bitko, S. N. Coppersmith, R. L. Leheny, N. Menon, S. R. Nagel, and T. F. Rosenbaum
http://dx.doi.org/10.6028/jres.102.016

Entropy, Free Volume, and Cooperative Relaxation, p. 213
Shiro Matsuoka
http://dx.doi.org/10.6028/jres.102.017

Conformational Entropy Contributions to the Glass Temperature of Blends of Miscible Polymers, p. 229
Hans Adam Schneider
http://dx.doi.org/10.6028/jres.102.018

Quest for Excellence IX- Conference Report, p. 249
Cap Frank
http://dx.doi.org/10.6028/jres.102.019

The 1994 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers, p. 279
Ambler Thompson, Edward A. Early, John DeLuisi, Patrick Disterhoft, David Wardle, James Kerr, John Rives, Yongchen Sun, Timothy Lucas, Tanya Mestechkina, and Patrick Neale
http://dx.doi.org/10.6028/jres.102.021

Improved Photometric Standards and Calibration Procedures at NIST, p. 323
Yoshihiro Ohno
http://dx.doi.org/10.6028/jres.102.022

Accurate Measurements of the Zero-Disperson Wavelength in Optical Fibers, p. 333
S. E. Mechels, J. B. Schlager, and D. L. Franzen
http://dx.doi.org/10.6028/jres.102.023

Creep and Creep Recovery Response of Load Cells Tested According to U.S. and International Evaluation Procedures, p. 349
Thomas W. Bartel and Simone L. Yaniv
http://dx.doi.org/10.6028/jres.102.024

Computation of Fresnel Integrals, p. 363
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.102.025

19th National Information Systems Security Conference- Conference Report, p. 367
Ellen Flahavin
http://dx.doi.org/10.6028/jres.102.026

First Annual Leveraging Cyberspace Conference- Conference Report, p. 371
Judy Moline
http://dx.doi.org/10.6028/jres.102.027

A Complete Multimode Equivalent-Circuit Theory for Electrical Design, p. 405
Dylan F. Williams, Leonard A. Hayden, and Roger B. Marks
http://dx.doi.org/10.6028/jres.102.029

Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation, p. 425
J. S. Villarrubia
http://dx.doi.org/10.6028/jres.102.030

Standardization of ⁶³Ni by 4-pi-beta Liquid Scintillation Spectrometry With ³H-Standard Efficiency Tracing, p. 455
B. E. Zimmerman and R. Collé
http://dx.doi.org/10.6028/jres.102.031

Calibration of High Heat Flux Sensors at NIST, p. 479
A. V. Murthy, B. K. Tsai, and C. E. Gibson
http://dx.doi.org/10.6028/jres.102.032

Workshop on Advanced Methods and Models for Appearance of Coatings and Coated Objects- Conference Report, p. 489
Mary E. McKnight, Jonathan W. Martin, Michael Galler, Fern Y. Hunt, Robert R. Lipman, Theodore V. Vorburger, and Ambler Thompson
http://dx.doi.org/10.6028/jres.102.033

A Compendium on the NIST Radionuclidic Assays of the Massic Activity of ⁶³Ni and ⁵⁵Fe Solutions Used for an International Intercomparison of Liquid Scintillation Spectrometry Techniques, p. 523
R. Collé and B. E. Zimmerman
http://dx.doi.org/10.6028/jres.102.035

Developments for a New Spectral Irradiance Scale at the National Institute of Standards and Technology, p. 551
Benjamin K. Tsai
http://dx.doi.org/10.6028/jres.102.036

On-Demand Generation of a Formaldehyde-in-Air Standard, p. 559
P. M. Chu, W. J. Thorn, R. L. Sams, and F. R. Guenther
http://dx.doi.org/10.6028/jres.102.037

New Method for Measuring Statistical Distributions of Partial Discharge Pulses, p. 569
Yicheng Wang
http://dx.doi.org/10.6028/jres.102.038

Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias, p. 577
Steven D. Phillips, Keith R. Eberhardt, and Brian Parry
http://dx.doi.org/10.6028/jres.102.039

A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement, p. 587
W. Tyler Estler
http://dx.doi.org/10.6028/jres.102.040

Radionuclide Metrology and Its Applications - ICRM '97- Conference Report, p. 589
J. M. R. Hutchinson and Michael Unterweger
http://dx.doi.org/10.6028/jres.102.041

Radiometric Measurement Comparison Using the Ocean Color Temperature Scanner (OCTS) Visible and Near Infrared Iantegrating Sphere, p. 627
B. Carol Johnson, F. Sakuma, J. J. Butler, S. F. Biggar, J. W. Cooper, J. Ishida, and K. Suzuki
http://dx.doi.org/10.6028/jres.102.043

Uncertainty and Dimensional Calibrations, p. 647
Ted Doiron and John Stoup
http://dx.doi.org/10.6028/jres.102.044

Current Distributions in Quantum Hall Effect Devices, p. 677
M. E. Cage
http://dx.doi.org/10.6028/jres.102.045

Electron-Impact Total Ionization Cross Sections of CH and C₂H₂, p. 693
Yong-Ki Kim, M. Asgar Ali, and M. Eugene Rudd
http://dx.doi.org/10.6028/jres.102.046

1997 Wireless Communications Conference- Conference Reports, p. 697
Roger B. Marks and Michael S. Heutmaker
http://dx.doi.org/10.6028/jres.102.047

The Automatic Radio Frequency Techniques Group Conference on Characterization of Broadband Telecommunications Components and Systems, p. 703
Roger B. Marks and Gary D. Alley
http://dx.doi.org/10.6028/jres.102.048

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 102

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 1997

Issue 2 March-April 1997

Issue 3 May-June 1997

Issue 4 July-August 1997

Issue 5 September-October 1997

Issue 6 November-December 1997

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